{"title":"微处理器嵌入式应用中的瞬态位翻转注入","authors":"R. Velazco, S. Rezgui","doi":"10.1109/OLT.2000.856616","DOIUrl":null,"url":null,"abstract":"This paper investigates a new methodology for transient bitflip injection, randomly in time and location, in microprocessor-based digital architectures. Experimental results performed on two different architectures illustrate the potentials of this new strategy.","PeriodicalId":334770,"journal":{"name":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Transient bitflip injection in microprocessor embedded applications\",\"authors\":\"R. Velazco, S. Rezgui\",\"doi\":\"10.1109/OLT.2000.856616\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper investigates a new methodology for transient bitflip injection, randomly in time and location, in microprocessor-based digital architectures. Experimental results performed on two different architectures illustrate the potentials of this new strategy.\",\"PeriodicalId\":334770,\"journal\":{\"name\":\"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OLT.2000.856616\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OLT.2000.856616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transient bitflip injection in microprocessor embedded applications
This paper investigates a new methodology for transient bitflip injection, randomly in time and location, in microprocessor-based digital architectures. Experimental results performed on two different architectures illustrate the potentials of this new strategy.