在测试设备应用中使用可重构fpga

B. Fawcett
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引用次数: 0

摘要

自1985年问世以来,现场可编程门阵列(FPGA)器件已被用于成千上万的设计中。在大多数情况下,在FPGA中实现的逻辑可以用更传统的逻辑器件实现,例如掩码门阵列或MSI/SSI器件。然而,fpga是一个更好的选择,因为没有非重复性的工程成本,更低的设计风险,更少的功耗,更快的设计和生产周期等。从本质上讲,fpga结合了门阵列的高集成度优势和用户可编程器件的上市时间优势,并且通常选择其他逻辑技术来获得这些优势
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Using reconfigurable FPGAs in test equipment applications
Since their introduction in 1985, Field Programmable Gate Array (FPGA) devices have been used in tens of thousands of designs. In most of these, logic implemented in an FPGA could have been implemented with more traditional logic devices-masked gate arrays, or MSI/SSI devices, for example. However, FPGAs were a better alternative for any number of reasons-no nonrecurring engineering costs, lower design risks, less power dissipation, faster design and production cycles, etc. In essence, FPGAs combine the high-integration benefits of gate arrays with the time-to-market benefits of a user-programmable device, and typically are selected over other logic technologies to gain these benefits.<>
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