采用1.15ps SAR-TDC的79dB SNDR, 10MHz BW, 675MS/s开环基于时间的ADC

W. El-Halwagy, P. Mousavi, Masum Hossain
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引用次数: 8

摘要

介绍了一种利用SAR-TDC作为量化器的一阶噪声型时域ADC。高分辨率相关双采样SAR-TDC提高了ADC的量化噪声水平。采用1位折叠VCO结构解决了VCO的非线性问题。利用前景数字校准进一步提高了ADC的线性度。在65nm CMOS中实现,675MS/s时域ADC在10MHz BW下实现了79.5/86.4dB的测量峰值SNDR/SFDR,同时消耗11.65mW。SAR-TDC的分辨率为1.15ps,测得峰值DNL/INL为0.64/0.65LSB。1位折叠VCO将VCO线性度从12%提高到0.17%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 79dB SNDR, 10MHz BW, 675MS/s open-loop time-based ADC employing a 1.15ps SAR-TDC
This paper introduces a first-order noise-shaped time-domain ADC utilizing SAR-TDC as quantizer. The high resolution correlated double sampling SAR-TDC improves the quantization noise level of the ADC. The VCO non-linearity is resolved by employing a 1-bit folded VCO architecture. The ADC linearity is further improved using foreground digital calibration. Implemented in 65nm CMOS, the 675MS/s time-domain ADC achieves measured peak SNDR/SFDR of 79.5/86.4dB in 10MHz BW while consuming 11.65mW. The SAR-TDC achieves 1.15ps resolution with peak measured DNL/INL of 0.64/0.65LSB. The 1-bit folded VCO improves the VCO linearity from 12% to 0.17%.
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