6Gbps存储应用级联重驱动的均衡调优和系统验证

Xinjun Zhang, M. Wei, Weifeng Shu, Yinglei Ren
{"title":"6Gbps存储应用级联重驱动的均衡调优和系统验证","authors":"Xinjun Zhang, M. Wei, Weifeng Shu, Yinglei Ren","doi":"10.1109/APEMC.2015.7175239","DOIUrl":null,"url":null,"abstract":"Equalization (EQ) tuning methodology and system validation strategy on cascaded re-drivers for 6Gbps SAS and SATA application are discussed in this paper. DOE (Design of Experiment) is applied in the EQ tuning process on the TX link for SATA Gen3 applications and on the RX link for these applications that the eye diagram inside the host silicon can be accessed. Eye diagram measurements are the primary choice of designers to know the design margin. For these designs whose eye diagram are not available, BER (Bit Error Rate) test has to be applied although it can't tell any design margin information with a positive BER report. It is a good practice to do BER test under four corners (high, low voltage and high, low temperature) and skew'ed silicon, a pass BER report in these corner cases can provide additional confidence on the system.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Equalization tuning and system validation on cascaded re-drivers for 6Gbps storage applications\",\"authors\":\"Xinjun Zhang, M. Wei, Weifeng Shu, Yinglei Ren\",\"doi\":\"10.1109/APEMC.2015.7175239\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Equalization (EQ) tuning methodology and system validation strategy on cascaded re-drivers for 6Gbps SAS and SATA application are discussed in this paper. DOE (Design of Experiment) is applied in the EQ tuning process on the TX link for SATA Gen3 applications and on the RX link for these applications that the eye diagram inside the host silicon can be accessed. Eye diagram measurements are the primary choice of designers to know the design margin. For these designs whose eye diagram are not available, BER (Bit Error Rate) test has to be applied although it can't tell any design margin information with a positive BER report. It is a good practice to do BER test under four corners (high, low voltage and high, low temperature) and skew'ed silicon, a pass BER report in these corner cases can provide additional confidence on the system.\",\"PeriodicalId\":325138,\"journal\":{\"name\":\"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEMC.2015.7175239\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2015.7175239","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文讨论了6Gbps SAS和SATA应用级联重驱动的均衡(EQ)调优方法和系统验证策略。DOE(实验设计)应用于SATA Gen3应用程序的TX链路和这些应用程序的RX链路上的EQ调谐过程,可以访问主机硅内部的眼图。眼图测量是设计师了解设计余量的主要选择。对于这些没有眼图的设计,必须应用误码率(BER)测试,尽管误码率报告为正并不能告诉任何设计余量信息。在四个角落(高、低电压和高、低温)和倾斜硅下进行误码率测试是一个很好的实践,在这些角落情况下通过误码率报告可以为系统提供额外的信心。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Equalization tuning and system validation on cascaded re-drivers for 6Gbps storage applications
Equalization (EQ) tuning methodology and system validation strategy on cascaded re-drivers for 6Gbps SAS and SATA application are discussed in this paper. DOE (Design of Experiment) is applied in the EQ tuning process on the TX link for SATA Gen3 applications and on the RX link for these applications that the eye diagram inside the host silicon can be accessed. Eye diagram measurements are the primary choice of designers to know the design margin. For these designs whose eye diagram are not available, BER (Bit Error Rate) test has to be applied although it can't tell any design margin information with a positive BER report. It is a good practice to do BER test under four corners (high, low voltage and high, low temperature) and skew'ed silicon, a pass BER report in these corner cases can provide additional confidence on the system.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信