Max-Fill:生成高质量延迟测试的方法

Xiaoxin Fan, S. Reddy, I. Pomeranz
{"title":"Max-Fill:生成高质量延迟测试的方法","authors":"Xiaoxin Fan, S. Reddy, I. Pomeranz","doi":"10.1109/DDECS.2011.5783114","DOIUrl":null,"url":null,"abstract":"It was recently observed that the methods to generate scan based tests with low switching activity cause about 40% less activity than functional tests. Thus such tests may cause test escapes as they may not adequately stress the circuits under test. In this work we propose a method called Max-Fill to generate high quality partially-functional broadside delay tests. The generated tests are shown to cause switching activity close to the switching activity during functional operation. The method computes a set of reachable states in which states are likely to cause high switching activity. During test generation phase, these states are used as background states to fill the unspecified bits of test cubes. Additionally, the number of test patterns produced is less than that produced by low power test methods. Experimental results for ISCAS-89 circuits are given.","PeriodicalId":231389,"journal":{"name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Max-Fill: A method to generate high quality delay tests\",\"authors\":\"Xiaoxin Fan, S. Reddy, I. Pomeranz\",\"doi\":\"10.1109/DDECS.2011.5783114\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It was recently observed that the methods to generate scan based tests with low switching activity cause about 40% less activity than functional tests. Thus such tests may cause test escapes as they may not adequately stress the circuits under test. In this work we propose a method called Max-Fill to generate high quality partially-functional broadside delay tests. The generated tests are shown to cause switching activity close to the switching activity during functional operation. The method computes a set of reachable states in which states are likely to cause high switching activity. During test generation phase, these states are used as background states to fill the unspecified bits of test cubes. Additionally, the number of test patterns produced is less than that produced by low power test methods. Experimental results for ISCAS-89 circuits are given.\",\"PeriodicalId\":231389,\"journal\":{\"name\":\"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems\",\"volume\":\"74 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-04-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2011.5783114\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2011.5783114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

最近观察到,生成具有低开关活动的基于扫描的测试的方法比功能测试的活动少约40%。因此,这样的测试可能会导致测试逃逸,因为它们可能没有充分地强调被测电路。在这项工作中,我们提出了一种称为Max-Fill的方法来生成高质量的部分功能宽带延迟测试。生成的测试显示在功能操作期间导致切换活动接近切换活动。该方法计算一组可达状态,这些状态可能导致高交换活动。在测试生成阶段,这些状态被用作背景状态来填充测试多维数据集的未指定位。此外,产生的测试模式的数量比低功耗测试方法产生的要少。给出了ISCAS-89电路的实验结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Max-Fill: A method to generate high quality delay tests
It was recently observed that the methods to generate scan based tests with low switching activity cause about 40% less activity than functional tests. Thus such tests may cause test escapes as they may not adequately stress the circuits under test. In this work we propose a method called Max-Fill to generate high quality partially-functional broadside delay tests. The generated tests are shown to cause switching activity close to the switching activity during functional operation. The method computes a set of reachable states in which states are likely to cause high switching activity. During test generation phase, these states are used as background states to fill the unspecified bits of test cubes. Additionally, the number of test patterns produced is less than that produced by low power test methods. Experimental results for ISCAS-89 circuits are given.
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