Y. Polansky, A. Lavan, R. Sahar, O. Dadashev, Y. Betser, G. Cohen, E. Maayan, B. Eitan, F. Ni, Y. Ku, Chih-Yuan Lu, T. Chen, Chun-Yu Liao, Chin-Hung Chang, C. Chen, Wen-Chiao Ho, Y. Shih, W. Ting, Wenpin Lu
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A 4b/cell 1Gb data flash based on a low-cost NROM process technology is achieved. The design includes a two-phase programming algorithm for supporting a fast and accurate threshold-voltage control. The read scheme incorporates a simple error-detection mechanism combined with an accurate drain-side sensing circuit with a built-in offset cancellation