A. Yamaguchi, Kenta Ogasawara, S. Sakai, T. Okumura, Koichi Naniwae
{"title":"基于ingan的激光二极管结构中的无源波导损耗测量","authors":"A. Yamaguchi, Kenta Ogasawara, S. Sakai, T. Okumura, Koichi Naniwae","doi":"10.23919/ISLC52947.2022.9943392","DOIUrl":null,"url":null,"abstract":"Waveguide loss spectrum in an InGaN laser diode (LD) has been measured and the results were compared with an InGaP LD. It is observed that the spectrum has a long tail in the InGaN LD while it shows a sharp rise in the InGaP LD.","PeriodicalId":443954,"journal":{"name":"2022 28th International Semiconductor Laser Conference (ISLC)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Passive waveguide loss measurements in an InGaN-based laser diode structure\",\"authors\":\"A. Yamaguchi, Kenta Ogasawara, S. Sakai, T. Okumura, Koichi Naniwae\",\"doi\":\"10.23919/ISLC52947.2022.9943392\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Waveguide loss spectrum in an InGaN laser diode (LD) has been measured and the results were compared with an InGaP LD. It is observed that the spectrum has a long tail in the InGaN LD while it shows a sharp rise in the InGaP LD.\",\"PeriodicalId\":443954,\"journal\":{\"name\":\"2022 28th International Semiconductor Laser Conference (ISLC)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 28th International Semiconductor Laser Conference (ISLC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/ISLC52947.2022.9943392\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 28th International Semiconductor Laser Conference (ISLC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ISLC52947.2022.9943392","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Passive waveguide loss measurements in an InGaN-based laser diode structure
Waveguide loss spectrum in an InGaN laser diode (LD) has been measured and the results were compared with an InGaP LD. It is observed that the spectrum has a long tail in the InGaN LD while it shows a sharp rise in the InGaP LD.