Pao-Chuan Shih, Hsien-chih Huang, Chien-An Wang, Jiun-Yun Li
{"title":"一种新型垂直隧道场效应管,带对带隧道与栅极电场排列,平均SS为28 mV/ 10年","authors":"Pao-Chuan Shih, Hsien-chih Huang, Chien-An Wang, Jiun-Yun Li","doi":"10.23919/SNW.2017.8242291","DOIUrl":null,"url":null,"abstract":"We propose a novel vertical tunnel FET of band-to-band tunneling aligned with the gate electric field. Simulation results show high drive current and extremely sharp subthreshold swing due to excellent gate control over the tunnel junction. OFF state leakage via source-to-drain tunneling is much suppressed by the spacer layer between the source and drain layers. Furthermore, this device is fully compatible to VLSI technology.","PeriodicalId":424135,"journal":{"name":"2017 Silicon Nanoelectronics Workshop (SNW)","volume":"117 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A novel vertical tunnel FET of band-to-band tunneling aligned with gate electric field with averaged SS of 28 mV/decade\",\"authors\":\"Pao-Chuan Shih, Hsien-chih Huang, Chien-An Wang, Jiun-Yun Li\",\"doi\":\"10.23919/SNW.2017.8242291\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a novel vertical tunnel FET of band-to-band tunneling aligned with the gate electric field. Simulation results show high drive current and extremely sharp subthreshold swing due to excellent gate control over the tunnel junction. OFF state leakage via source-to-drain tunneling is much suppressed by the spacer layer between the source and drain layers. Furthermore, this device is fully compatible to VLSI technology.\",\"PeriodicalId\":424135,\"journal\":{\"name\":\"2017 Silicon Nanoelectronics Workshop (SNW)\",\"volume\":\"117 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 Silicon Nanoelectronics Workshop (SNW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/SNW.2017.8242291\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Silicon Nanoelectronics Workshop (SNW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/SNW.2017.8242291","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel vertical tunnel FET of band-to-band tunneling aligned with gate electric field with averaged SS of 28 mV/decade
We propose a novel vertical tunnel FET of band-to-band tunneling aligned with the gate electric field. Simulation results show high drive current and extremely sharp subthreshold swing due to excellent gate control over the tunnel junction. OFF state leakage via source-to-drain tunneling is much suppressed by the spacer layer between the source and drain layers. Furthermore, this device is fully compatible to VLSI technology.