{"title":"利用梯形高斯曲面建立了短沟道MOS晶体管的物理直流模型","authors":"W. Chaisirithavornkul, V. Kasemsuwan","doi":"10.1109/SMELEC.2000.932300","DOIUrl":null,"url":null,"abstract":"A physical DC model for short channel MOSFET is presented. The model accounts for several second order effects including the vertical and horizontal mobility degradations, velocity saturation, and the channel length modulation. Accurate electric widths at the saturation point and the drain field around the drain end is obtained through the quasi two dimensional approximation (QTDA) using Gaussian surface with trapezoidal shape. The theoretical predictions of the model show good agreement with experimental data available in the literature over a wide range of biasing conditions.","PeriodicalId":359114,"journal":{"name":"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A physical DC model of short channel MOS transistor using trapezoidal Gaussian surface\",\"authors\":\"W. Chaisirithavornkul, V. Kasemsuwan\",\"doi\":\"10.1109/SMELEC.2000.932300\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A physical DC model for short channel MOSFET is presented. The model accounts for several second order effects including the vertical and horizontal mobility degradations, velocity saturation, and the channel length modulation. Accurate electric widths at the saturation point and the drain field around the drain end is obtained through the quasi two dimensional approximation (QTDA) using Gaussian surface with trapezoidal shape. The theoretical predictions of the model show good agreement with experimental data available in the literature over a wide range of biasing conditions.\",\"PeriodicalId\":359114,\"journal\":{\"name\":\"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)\",\"volume\":\"115 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-11-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMELEC.2000.932300\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMELEC.2000.932300","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A physical DC model of short channel MOS transistor using trapezoidal Gaussian surface
A physical DC model for short channel MOSFET is presented. The model accounts for several second order effects including the vertical and horizontal mobility degradations, velocity saturation, and the channel length modulation. Accurate electric widths at the saturation point and the drain field around the drain end is obtained through the quasi two dimensional approximation (QTDA) using Gaussian surface with trapezoidal shape. The theoretical predictions of the model show good agreement with experimental data available in the literature over a wide range of biasing conditions.