采用45纳米CMOS/ 0.2gm GaN异质技术的全集成S/C波段发射机

M. LaRue, B. Dupaix, S. Rashid, T. Barton, T. James, W. Gouty, P. Watson, T. Quach, W. Khalil
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引用次数: 6

摘要

采用DARPA的DAHI工艺技术,提出了一种完全集成的发射机,具有45纳米SOI CMOS和0.2pm GaN技术的异构集成。该发射机能够在2-5 GHz范围内传输SOQPSK-TG遥测波形,峰值发射机功率效率为41.32%,峰值输出功率为32.93 dBm。实现了一个可重构的CMOS相位调制器,在整个输出频率范围内提供6位相位分辨率,设计了一个宽摆CMOS缓冲器来驱动GaN功率放大器。GaN PA采用三级设计,具有差分CML缓冲器,推挽反相缓冲器和e类开关模式功率放大器,可有效放大信号。据作者所知,这是文献中第一个结合CMOS和GaN技术的完全集成的发射机。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A fully-integrated S/C band transmitter in 45nm CMOS/ 0.2gm GaN heterogeneous technology
A fully-integrated transmitter is presented in DARPA's DAHI process technology, featuring heterogeneous integration of 45nm SOI CMOS and 0.2pm GaN technologies. This transmitter is capable of transmitting SOQPSK-TG telemetry waveforms across 2–5 GHz with a peak transmitter power efficiency of 41.32% and peak output power of 32.93 dBm. A reconfigurable CMOS phase modulator is implemented to provide 6-bit phase resolution across the entire output frequency range, and a wide-swing CMOS buffer was designed to drive the GaN power amplifier. The GaN PA features a three-stage design, featuring a differential CML buffer, push-pull inverting buffer, and a class-E switch-mode power amplifier to efficiently amplify the signal. To the authors' knowledge, this is the first fully-integrated transmitter combining CMOS and GaN technology demonstrated in literature.
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