Michihiro Shintani, Masayuki Hiromoto, Takashi Sato
{"title":"基于自动微分的SPICE紧凑模型的高效参数提取","authors":"Michihiro Shintani, Masayuki Hiromoto, Takashi Sato","doi":"10.1109/ICMTS.2018.8383759","DOIUrl":null,"url":null,"abstract":"A novel parameter extraction method for compact MOSFET models is proposed. The proposed method exploits automatic differentiation (AD) technique that is widely used in the training of artificial neural networks. In the AD technique, gradient of all the parameters of the MOSFET model is analytically calculated as a graph to reduce computational cost. On the basis of the calculated gradient, the model parameters are efficiently optimized. Through experiments using SPICE models, the parameter extraction using the proposed method achieved 7.01x speedup compared to that using the numerical-differentiation method.","PeriodicalId":271839,"journal":{"name":"2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)","volume":"22 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Efficient parameter-extraction of SPICE compact model through automatic differentiation\",\"authors\":\"Michihiro Shintani, Masayuki Hiromoto, Takashi Sato\",\"doi\":\"10.1109/ICMTS.2018.8383759\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel parameter extraction method for compact MOSFET models is proposed. The proposed method exploits automatic differentiation (AD) technique that is widely used in the training of artificial neural networks. In the AD technique, gradient of all the parameters of the MOSFET model is analytically calculated as a graph to reduce computational cost. On the basis of the calculated gradient, the model parameters are efficiently optimized. Through experiments using SPICE models, the parameter extraction using the proposed method achieved 7.01x speedup compared to that using the numerical-differentiation method.\",\"PeriodicalId\":271839,\"journal\":{\"name\":\"2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)\",\"volume\":\"22 3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-03-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.2018.8383759\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2018.8383759","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Efficient parameter-extraction of SPICE compact model through automatic differentiation
A novel parameter extraction method for compact MOSFET models is proposed. The proposed method exploits automatic differentiation (AD) technique that is widely used in the training of artificial neural networks. In the AD technique, gradient of all the parameters of the MOSFET model is analytically calculated as a graph to reduce computational cost. On the basis of the calculated gradient, the model parameters are efficiently optimized. Through experiments using SPICE models, the parameter extraction using the proposed method achieved 7.01x speedup compared to that using the numerical-differentiation method.