2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)

查看最新文献

888

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - 最新文献

Measurement time reduction technique for input referred noise of dynamic comparator

Pub Date : 2018-06-12 DOI: 10.1109/ICMTS.2018.8383799 Yukiko Ishijima, S. Nakagawa, H. Ishikuro

Novel test structures for extracting interface state density of advanced CMOSFETs using optical charge pumping

Pub Date : 2018-03-19 DOI: 10.1109/ICMTS.2018.8383753 Hyeong-Sub Song, Dong-Jun Oh, So-Yeong Kim, Sungkyu Kwon, Sung-Jin Choi, D. Kim, D. Lim, Changhwan Choi, D. M. Kim, H. Lee

Quantitative model of CMOS inverter chain ring oscillator's effective capacitance and its improvements in 14nm FinFET technology

Pub Date : 2018-03-19 DOI: 10.1109/ICMTS.2018.8383787 S. Mun, J. Cho, B. Zhu, P. Agnihotri, C. Y. Wong, T. Lee, V. Mahajan, B. Liu, Y. Shi, W. Hong, J. Ciavatti, J. G. Lee, S. Samavedam, D. K. Sohn

查看全部

免责声明：
本页显示期刊或杂志信息，仅供参考学习，不是任何期刊杂志官网，不涉及出版事务，特此申明。如需出版一切事务需要用户自己向出版商联系核实。若本页展示内容有任何问题，请联系我们，邮箱：info@booksci.cn，我们会认真核实处理。