最坏的情况下,时钟偏差在电源变化

TAU '02 Pub Date : 2002-12-02 DOI:10.1145/589411.589416
Min Zhao, Kaushik Gala, V. Zolotov, Yuhong Fu, R. Panda, R. Ramkumar, B. K. Agrawal
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引用次数: 17

摘要

片上配电网络本质上是电阻性的,因此在整个芯片上产生很大的电压水平变化。这些变化对全球信号的延迟有重大影响,比如时钟,它跨越整个芯片。在不考虑电源变化引起的延迟变化的情况下进行平衡的时钟网络可能会在芯片运行期间遭受其倾斜的显着退化。在本文中,我们描述了在电源变化的情况下确定时钟网络中最坏情况偏差的实用方法。在多个处理器的时钟网络上进行的实验表明,在最坏的情况下,时钟偏差几乎可以翻倍。该方法易于扩展,可用于研究工艺变化和片上寄生电感对时钟偏差的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Worst case clock skew under power supply variations
On-chip power distribution networks are resistive in nature and hence create large variations in the voltage levels across the chip. These variations have significant impact on the delays of global signals, such as the clock, which span the entire chip. A clock network that is balanced without considering delay variations induced by power supply variations can suffer significant degradation of its skew during the chips operation. In this paper, we describe a practical approach to determining the worst-case skew in a clock network in the presence of power supply variations. Experiments using the proposed approach on the clock nets of several processors show that clock skew can nearly double in the worst case. The proposed methodology is easily extendable for studying the impact of process variations and on-chip parasitic inductance on clock skew.
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