基于脉冲激光和重离子测试的高低侧栅极驱动器(RIC7S113)的SET特性

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI:10.1109/REDW56037.2022.9921552

J. Warner, Eric Faraci, Chi H. Pham, A. Khachatrian, D. McMorrow

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引用次数: 0

摘要

采用脉冲激光和重离子加速器测试对RIC7S113栅极驱动器的SET响应进行了表征。比较了两种方法的SET响应。

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SET Characterization of a High and Low Side Gate Driver (RIC7S113) using Pulsed Laser and Heavy Ion Testing

The SET response of the RIC7S113 gate driver was characterized using pulsed laser and heavy ion accelerator testing. The SET response between the two methods are compared.

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来源期刊

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)

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