{"title":"一种先进的水滴激光等离子体极紫外光源","authors":"F. Jin, M. Richardson, G. Shimkaveg, D. Torres","doi":"10.1364/eul.1996.es89","DOIUrl":null,"url":null,"abstract":"We describe the operation of a laser-plasma EUV source that satisfies\n all the requirements for projection lithography at 13 nm or 11.6 nm.\n We demonstrate that this source, based on mass-limited water droplets\n as a laser plasma target is essentially debris-free, produces\n narrow-line EUV emission, is continuous in operation and is\n practically cost less.","PeriodicalId":201185,"journal":{"name":"Extreme Ultraviolet Lithography (TOPS)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"An Advanced EUV source from water droplet laser plasma\",\"authors\":\"F. Jin, M. Richardson, G. Shimkaveg, D. Torres\",\"doi\":\"10.1364/eul.1996.es89\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We describe the operation of a laser-plasma EUV source that satisfies\\n all the requirements for projection lithography at 13 nm or 11.6 nm.\\n We demonstrate that this source, based on mass-limited water droplets\\n as a laser plasma target is essentially debris-free, produces\\n narrow-line EUV emission, is continuous in operation and is\\n practically cost less.\",\"PeriodicalId\":201185,\"journal\":{\"name\":\"Extreme Ultraviolet Lithography (TOPS)\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Extreme Ultraviolet Lithography (TOPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/eul.1996.es89\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Extreme Ultraviolet Lithography (TOPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/eul.1996.es89","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Advanced EUV source from water droplet laser plasma
We describe the operation of a laser-plasma EUV source that satisfies
all the requirements for projection lithography at 13 nm or 11.6 nm.
We demonstrate that this source, based on mass-limited water droplets
as a laser plasma target is essentially debris-free, produces
narrow-line EUV emission, is continuous in operation and is
practically cost less.