关于多值集成电路的性能:过去、现在和未来

D. Etiemble
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引用次数: 35

摘要

分析了过去设计的成功的m值I/sup 2/L和rom的特点,并讨论了它们成功的原因。研究了与m值CMOS电流模式电路的缩放有关的问题。考虑了容差问题、二进制和m值集成电路各自的传播延迟以及互连问题。指出了m值电路在与二进制电路的指数性能增长竞争中所面临的挑战
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the performance of multivalued integrated circuits: past, present and future
The characteristics of the successful m-valued I/sup 2/L and ROMs that have been designed in the past are examined, and the reasons for their success are discussed. The problems associated with scaling of m-valued CMOS current mode circuits are examined. The tolerance issue, the respective propagation delays of binary and m-valued ICs, and the interconnection issue are considered. The challenges for m-valued circuits in competition with the exponential performance increase of binary circuits are identified.<>
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