注射点选择对军用低频抗扰试验结果的影响

S. Cakir, O. Sen, Mesut Ozturk, M. Celep
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引用次数: 3

摘要

MIL-STD-461F CS101测试是军用和航空航天设备在30 Hz和150 kHz之间必不可少的低频传导抗扰度测试之一,但它在应用中存在一些挑战和缺陷。主要的缺陷是需要在EUT的工频存在下测量注入的CS101在EUT和电源侧的波纹,我们在早期的论文中已经对其解决方案进行了深入的研究和介绍。另一个关键缺陷是,注入点和去耦电容位置的影响可能达到显著水平,特别是在30 kHz以上。因此,在本研究中,我们广泛研究和论证了注入点位置和$10 \ \mu\ mathm {F}$去耦电容对测试结果的影响,特别是在30 kHz时,并最终提出了解决这一问题的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence of Injection Point Selection on Military Low Frequency Immunity Test Results
The MIL-STD-461F CS101 test is one of the essential low-frequency conducted immunity tests for military and aerospace equipment between 30 Hz and 150 kHz, however it includes some challenges and pitfalls in application. The major pitfall is the necessity for the measurement of injected CS101 ripples across the EUT and also across the power source side under the presence of the power frequency of the EUT, whose solutions have been thoroughly studied and introduced in our earlier papers. The other critical pitfall is that the influence of the injection point and the decoupling capacitor position may reach significant levels especially beyond 30 kHz. Therefore, in this research, we extensively study and demonstrate the influence of the positions of the injection point and the $10 \ \mu\mathrm{F}$ decoupling capacitor on test results especially as from 30 kHz and ultimately propose solutions to this issue.
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