小芯片时代异构集成与封装的演变

S. Skordas
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引用次数: 0

摘要

自从IBM开创微电子封装以来,IBM研究院一直在不断创新,以确保封装和异构集成技术能够满足高性能计算系统对性能、复杂性、内存和逻辑密度的需求。在这个对高性能计算和人工智能需求不断扩大的时代,传统的规模经济逆风与对多功能性和快速产品开发的需求相结合,要求采用系统级方法来产生行业过去通过更传统的规模方法能够提供的效率。这种系统级方法使得使用基于芯片的架构、异构集成和先进封装成为当务之急,以实现性能最佳、效率最高的IP组件的分解,从而在实现性能目标的同时维持可行的经济模型。在本次演讲中,我们将讨论驱动各种水平和垂直互连技术元素使用的几个关键过程和集成考虑因素,这些技术元素必须实施,才能在人工智能时代成功实现高效且具有成本效益的高性能系统。这些技术前沿的未来进展将取决于两个关键领域的颠覆性创新:(a)晶片级和模具级工艺,如光刻图版、晶片-晶片粘合和脱粘、粘合和组装工艺等,可以在不影响性能和可靠性的情况下实现这些异质结构的封装;(b)相应的改进和实现适当的计量和检测解决方案,以解决这些新的晶片互连方法和相关的地形影响所带来的挑战。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The evolution of heterogeneous integration and packaging for the age of chiplets
Ever since IBM pioneered microelectronics packaging, IBM Research has continued to innovate to ensure that packaging and heterogeneous integration technology is available to satisfy the needs for performance, complexity, and memory and logic density with regard to high performance computing systems. In this era of ever-expanding need for high-performance computing and ever-pervasive artificial intelligence, traditional scaling economics headwinds combined with the need for versatility and fast product development mandate a system-level approach to generate the efficiencies the industry has been able to provide in the past through more traditional scaling approaches. This system-level approach renders imperative the use of chiplet-based architectures and the use of heterogeneous integration and advanced packaging to achieve the disaggregation with best-performing and most efficient IP components to sustain a viable economic model while achieving performance targets. In this talk we will discuss several key process and integration considerations that drive the use of various horizontal and vertical interconnection technology elements that must be implemented to enable the successful realization of efficient and cost-effective high-performance systems in the AI era. Future progress on these technology fronts will depend on disruptive innovation in two critical areas: (a) wafer-level and die-level processes, such as lithographic patterning, wafer-wafer bonding and debonding, bond and assembly processes, etc. that can enable packaging of these heterogeneous structures without compromising performance and reliability, (b) commensurate improvements and enablement of adequate metrology and inspection solutions to address the challenges stemming from these new chiplet-interconnecting methods and the associated topographic implications.
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