{"title":"航空航天电子设备改进的高加速寿命试验","authors":"F.F. Wang","doi":"10.1109/ITHERM.2002.1012557","DOIUrl":null,"url":null,"abstract":"Highly accelerated life test (HALT) uses stimulation to find out the weakness of the product and thus improve the quality. The current HALT test has its limitations. Aerospace electronics face much higher vibration environments than consumer electronics and telecom industries. In many cases, the traditional HALT testing level may not be high enough to stimulate a failure. That defeats the purpose of HALT. Aerospace electronics also require a more regulated testing with predictable results. Current HALT procedure has many random factors which may change the outcome of the testing. The product that passed HALT may not be able to pass the same level qualification test. The proposed modified HALT test uses the same traditional chamber used by most aerospace electronics manufacturers and performs at a level of 80% or more of the traditional HALT test. The results are more regulated and predictable. The failure mechanism will be more obvious to detect. The results can also be used to calculate the reliability of the product using the most published methods.","PeriodicalId":299933,"journal":{"name":"ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258)","volume":"313 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Modified highly accelerated life test for aerospace electronics\",\"authors\":\"F.F. Wang\",\"doi\":\"10.1109/ITHERM.2002.1012557\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Highly accelerated life test (HALT) uses stimulation to find out the weakness of the product and thus improve the quality. The current HALT test has its limitations. Aerospace electronics face much higher vibration environments than consumer electronics and telecom industries. In many cases, the traditional HALT testing level may not be high enough to stimulate a failure. That defeats the purpose of HALT. Aerospace electronics also require a more regulated testing with predictable results. Current HALT procedure has many random factors which may change the outcome of the testing. The product that passed HALT may not be able to pass the same level qualification test. The proposed modified HALT test uses the same traditional chamber used by most aerospace electronics manufacturers and performs at a level of 80% or more of the traditional HALT test. The results are more regulated and predictable. The failure mechanism will be more obvious to detect. The results can also be used to calculate the reliability of the product using the most published methods.\",\"PeriodicalId\":299933,\"journal\":{\"name\":\"ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258)\",\"volume\":\"313 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ITHERM.2002.1012557\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITHERM.2002.1012557","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modified highly accelerated life test for aerospace electronics
Highly accelerated life test (HALT) uses stimulation to find out the weakness of the product and thus improve the quality. The current HALT test has its limitations. Aerospace electronics face much higher vibration environments than consumer electronics and telecom industries. In many cases, the traditional HALT testing level may not be high enough to stimulate a failure. That defeats the purpose of HALT. Aerospace electronics also require a more regulated testing with predictable results. Current HALT procedure has many random factors which may change the outcome of the testing. The product that passed HALT may not be able to pass the same level qualification test. The proposed modified HALT test uses the same traditional chamber used by most aerospace electronics manufacturers and performs at a level of 80% or more of the traditional HALT test. The results are more regulated and predictable. The failure mechanism will be more obvious to detect. The results can also be used to calculate the reliability of the product using the most published methods.