航空航天电子设备改进的高加速寿命试验

F.F. Wang
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引用次数: 8

摘要

高加速寿命试验(HALT)是通过刺激来发现产品的弱点,从而提高产品的质量。目前的HALT测试有其局限性。与消费电子和电信行业相比,航空航天电子产品面临着更高的振动环境。在许多情况下,传统的HALT测试水平可能不够高,不足以引发故障。这违背了HALT的目的。航空电子产品也需要更规范的测试和可预测的结果。目前的HALT程序有许多随机因素,可能会改变测试结果。通过HALT的产品可能无法通过同级资格测试。拟议修改的HALT测试使用与大多数航空航天电子制造商使用的相同的传统腔室,其性能达到传统HALT测试的80%或更高水平。结果更加规范和可预测。故障机制将更容易被发现。结果也可以用来计算产品的可靠性使用最公开的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modified highly accelerated life test for aerospace electronics
Highly accelerated life test (HALT) uses stimulation to find out the weakness of the product and thus improve the quality. The current HALT test has its limitations. Aerospace electronics face much higher vibration environments than consumer electronics and telecom industries. In many cases, the traditional HALT testing level may not be high enough to stimulate a failure. That defeats the purpose of HALT. Aerospace electronics also require a more regulated testing with predictable results. Current HALT procedure has many random factors which may change the outcome of the testing. The product that passed HALT may not be able to pass the same level qualification test. The proposed modified HALT test uses the same traditional chamber used by most aerospace electronics manufacturers and performs at a level of 80% or more of the traditional HALT test. The results are more regulated and predictable. The failure mechanism will be more obvious to detect. The results can also be used to calculate the reliability of the product using the most published methods.
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