精确混叠计算和/或无混叠设计的RAM BIST

Records of the 1993 IEEE International Workshop on Memory Testing Pub Date : 1993-08-09 DOI:10.1109/MT.1993.263155

V. Yarmolik, M. Nicolaidis

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引用次数: 2

摘要

特征分析仪是BIST技术中非常有效的输出响应压缩器。签名分析的唯一限制是由于任何数据压缩所固有的信息丢失而导致的故障覆盖减少(混叠)。在本文中，为了提高RAM测试算法的有效性，作者利用RAM测试算法的规律性，证明在RAM测试算法中可以实现精确的混叠计算和/或无混叠特征分析。

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Exact aliasing computation and/or aliasing free design for RAM BIST

Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, the authors take advantage from the regularity of the RAM test algorithms and show that exact aliasing computation and/or aliasing free signature analysis can be achieved in RAM BIST.<>

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Records of the 1993 IEEE International Workshop on Memory Testing

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