基于ARM和RISC-V的EM故障注入

Mahmoud A. Elmohr, Haohao Liao, C. Gebotys
{"title":"基于ARM和RISC-V的EM故障注入","authors":"Mahmoud A. Elmohr, Haohao Liao, C. Gebotys","doi":"10.1109/ISQED48828.2020.9137051","DOIUrl":null,"url":null,"abstract":"Recently Electro-Magnetic Fault Injection (EMFI) techniques have been found to have significant implications on the security of embedded devices. Unfortunately, there is still a lack of understanding of EM faults and countermeasures for embedded processors. For the first time, this paper empirically shows that EMFI can cause skipping/faulting of more than one instruction on a 320MHz RISC-V processor, thus making it susceptible to a wider range of attacks. Additionally, empirical results on ARM Cortex M0 and RISC-V embedded processors show that EMFI is more susceptible at lower supply voltages and higher clock frequencies. Exception codes are also shown to be useful in understanding details of injected faults, providing further evidence that instructions have been corrupted in many cases. This research aims to enhance the understanding of faults, in order to better design countermeasures for embedded processors resistant to fault injection attacks.","PeriodicalId":225828,"journal":{"name":"2020 21st International Symposium on Quality Electronic Design (ISQED)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":"{\"title\":\"EM Fault Injection on ARM and RISC-V\",\"authors\":\"Mahmoud A. Elmohr, Haohao Liao, C. Gebotys\",\"doi\":\"10.1109/ISQED48828.2020.9137051\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recently Electro-Magnetic Fault Injection (EMFI) techniques have been found to have significant implications on the security of embedded devices. Unfortunately, there is still a lack of understanding of EM faults and countermeasures for embedded processors. For the first time, this paper empirically shows that EMFI can cause skipping/faulting of more than one instruction on a 320MHz RISC-V processor, thus making it susceptible to a wider range of attacks. Additionally, empirical results on ARM Cortex M0 and RISC-V embedded processors show that EMFI is more susceptible at lower supply voltages and higher clock frequencies. Exception codes are also shown to be useful in understanding details of injected faults, providing further evidence that instructions have been corrupted in many cases. This research aims to enhance the understanding of faults, in order to better design countermeasures for embedded processors resistant to fault injection attacks.\",\"PeriodicalId\":225828,\"journal\":{\"name\":\"2020 21st International Symposium on Quality Electronic Design (ISQED)\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"23\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 21st International Symposium on Quality Electronic Design (ISQED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED48828.2020.9137051\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 21st International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED48828.2020.9137051","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 23

摘要

近年来,人们发现电磁故障注入(EMFI)技术对嵌入式设备的安全具有重要意义。不幸的是,人们对嵌入式处理器的电磁故障和对策仍然缺乏了解。本文首次实证表明,EMFI可以导致320MHz RISC-V处理器上多条指令的跳变/故障,从而使其容易受到更广泛的攻击。此外,在ARM Cortex M0和RISC-V嵌入式处理器上的实证结果表明,EMFI在较低的电源电压和较高的时钟频率下更容易受到影响。异常代码在理解注入错误的细节方面也很有用,它提供了指令在许多情况下被破坏的进一步证据。本研究旨在增强对故障的理解,以便更好地设计嵌入式处理器抵御故障注入攻击的对策。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
EM Fault Injection on ARM and RISC-V
Recently Electro-Magnetic Fault Injection (EMFI) techniques have been found to have significant implications on the security of embedded devices. Unfortunately, there is still a lack of understanding of EM faults and countermeasures for embedded processors. For the first time, this paper empirically shows that EMFI can cause skipping/faulting of more than one instruction on a 320MHz RISC-V processor, thus making it susceptible to a wider range of attacks. Additionally, empirical results on ARM Cortex M0 and RISC-V embedded processors show that EMFI is more susceptible at lower supply voltages and higher clock frequencies. Exception codes are also shown to be useful in understanding details of injected faults, providing further evidence that instructions have been corrupted in many cases. This research aims to enhance the understanding of faults, in order to better design countermeasures for embedded processors resistant to fault injection attacks.
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