一个具有少量高可靠性细胞的功能单元

2008 14th IEEE Pacific Rim International Symposium on Dependable Computing Pub Date : 2008-03-28 DOI:10.1109/PRDC.2008.39

Kouki Suzuki, Takashi Nakada, M. Nakanishi, S. Yamashita, Y. Nakashima

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引用次数: 0

摘要

近年来，小型化进程带来了晶体管品种的增加和晶体管故障率的提高。我们提出了几种新的标准电池。所提出的电池可以校正和检测晶体管的故障。具有上述单元的功能单元具有更好的容错性。该单元的面积约为传统单元的1.4倍。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A Functional Unit with Small Variety of Highly Reliable Cells

Recently, the miniaturization process has brought an increase in transistor variations and in the failure rate at transistors. We propose a small variety of new standard cells. The proposed cells can correct and detect transistor faults. A functional unit with the proposed cells shows better fault tolerance. The area of this unit is approximately 1.4 times that of traditional cells.

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2008 14th IEEE Pacific Rim International Symposium on Dependable Computing

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