{"title":"一种平均噪声系数2.2 dB的16-24 GHz CMOS SOI LNA","authors":"T. Kanar, Gabriel M. Rebeiz","doi":"10.1109/CSICS.2013.6659186","DOIUrl":null,"url":null,"abstract":"This paper presents a K-band low-noise amplifier (LNA) with a measured mean noise figure of 2.2 dB at 16-24 GHz. The LNA is fabricated in 45 nm Semiconductor-on-Insulator (SOI) CMOS process. The measured S-parameters result a peak gain of 19.5 dB at 20 GHz and S11 <; -10 dB at 16-24 GHz. The design shows that CMOS SOI process can provide a comparable noise performance with GaAs and SiGe devices. To the best of authors' knowledge, this LNA achieves the lowest noise figure at K-band in any CMOS process.","PeriodicalId":257256,"journal":{"name":"2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"A 16-24 GHz CMOS SOI LNA with 2.2 dB Mean Noise Figure\",\"authors\":\"T. Kanar, Gabriel M. Rebeiz\",\"doi\":\"10.1109/CSICS.2013.6659186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a K-band low-noise amplifier (LNA) with a measured mean noise figure of 2.2 dB at 16-24 GHz. The LNA is fabricated in 45 nm Semiconductor-on-Insulator (SOI) CMOS process. The measured S-parameters result a peak gain of 19.5 dB at 20 GHz and S11 <; -10 dB at 16-24 GHz. The design shows that CMOS SOI process can provide a comparable noise performance with GaAs and SiGe devices. To the best of authors' knowledge, this LNA achieves the lowest noise figure at K-band in any CMOS process.\",\"PeriodicalId\":257256,\"journal\":{\"name\":\"2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSICS.2013.6659186\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSICS.2013.6659186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 16-24 GHz CMOS SOI LNA with 2.2 dB Mean Noise Figure
This paper presents a K-band low-noise amplifier (LNA) with a measured mean noise figure of 2.2 dB at 16-24 GHz. The LNA is fabricated in 45 nm Semiconductor-on-Insulator (SOI) CMOS process. The measured S-parameters result a peak gain of 19.5 dB at 20 GHz and S11 <; -10 dB at 16-24 GHz. The design shows that CMOS SOI process can provide a comparable noise performance with GaAs and SiGe devices. To the best of authors' knowledge, this LNA achieves the lowest noise figure at K-band in any CMOS process.