{"title":"基于归一化误差的VNA验证过程评价","authors":"Y. Lee","doi":"10.1109/ARFTG.2007.8376230","DOIUrl":null,"url":null,"abstract":"Verification kits are used as common tools for demonstrating measurement traceability of a Vector Network Analyzer (VNA), and for verifying the process control of the routine calibrations or inter-laboratory comparison. Such measurements performed by a national metrology lab or a secondary cal lab are very accurate due to the tremendous advancement of modern vector network analyzers. An inter-laboratory comparison of verification kits was established and is currently managed by the ARFTG. A robust statistical tool was used to improve the accuracy of the comparison by excluding outliers from the cumulative data of various participants. A statistical bound based on the median of absolute deviation (MAD) provide an evaluation method for the users in determining the pass or fail of their measurements. In this paper, a normalized error method and also z-score procedure are both discussed for their applicability as pass/fail criteria. Finally examples using the normalized error method, which is highly utilized by the metrology community, will be presented. A numeric metric encompassing the interpretation of results will be provided.","PeriodicalId":199632,"journal":{"name":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Evaluation of the VNA verification process based on the normalized errors\",\"authors\":\"Y. Lee\",\"doi\":\"10.1109/ARFTG.2007.8376230\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Verification kits are used as common tools for demonstrating measurement traceability of a Vector Network Analyzer (VNA), and for verifying the process control of the routine calibrations or inter-laboratory comparison. Such measurements performed by a national metrology lab or a secondary cal lab are very accurate due to the tremendous advancement of modern vector network analyzers. An inter-laboratory comparison of verification kits was established and is currently managed by the ARFTG. A robust statistical tool was used to improve the accuracy of the comparison by excluding outliers from the cumulative data of various participants. A statistical bound based on the median of absolute deviation (MAD) provide an evaluation method for the users in determining the pass or fail of their measurements. In this paper, a normalized error method and also z-score procedure are both discussed for their applicability as pass/fail criteria. Finally examples using the normalized error method, which is highly utilized by the metrology community, will be presented. A numeric metric encompassing the interpretation of results will be provided.\",\"PeriodicalId\":199632,\"journal\":{\"name\":\"2007 70th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 70th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2007.8376230\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 70th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2007.8376230","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evaluation of the VNA verification process based on the normalized errors
Verification kits are used as common tools for demonstrating measurement traceability of a Vector Network Analyzer (VNA), and for verifying the process control of the routine calibrations or inter-laboratory comparison. Such measurements performed by a national metrology lab or a secondary cal lab are very accurate due to the tremendous advancement of modern vector network analyzers. An inter-laboratory comparison of verification kits was established and is currently managed by the ARFTG. A robust statistical tool was used to improve the accuracy of the comparison by excluding outliers from the cumulative data of various participants. A statistical bound based on the median of absolute deviation (MAD) provide an evaluation method for the users in determining the pass or fail of their measurements. In this paper, a normalized error method and also z-score procedure are both discussed for their applicability as pass/fail criteria. Finally examples using the normalized error method, which is highly utilized by the metrology community, will be presented. A numeric metric encompassing the interpretation of results will be provided.