评估DFM库优化对微处理器核心中α诱导的SEU灵敏度的影响

2009 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 1900-01-01 DOI:10.1109/radecs.2009.5994699

P. Rech, A. Paccagnella, M. Grosso, M. Reorda, F. Melchiori, D. Appello

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引用次数: 0

摘要

本文介绍并讨论了在嵌入式8051微处理器内核上用三种不同的单元库实现的Alpha单事件干扰(SEU)测试的结果。每个标准单元库基于不同的可制造性设计(DFM)优化策略;我们的目标是了解这些策略如何影响设备对α诱导的软错误的敏感性。利用先进的可测试性设计(DfT)方法对三种实现进行了测试，并对辐射实验结果进行了比较。

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Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core

This paper presents and discusses the results of Alpha Single Event Upset (SEU) tests on an embedded 8051 microprocessor core implemented in three different cell libraries. Each standard cell library is based on a different Design For Manufacturability (DFM) optimization strategy; our goal is to understand how these strategies may affect the device sensitivity to alpha-induced Soft Errors. The three implementations are tested exploiting advanced Design for Testability (DfT) methodologies and radiation experiments results are compared.

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2009 European Conference on Radiation and Its Effects on Components and Systems

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