Daniel Martin, P. Killeen, W. A. Curbow, Brett Sparkman, Lauren E. Kegley, T. McNutt
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引用次数: 15
摘要
本文比较了采用反并联SiC肖特基势垒二极管(SBD)的1200v SiC MOSFET半桥功率模块与仅采用SiC MOSFET固有体二极管的相同功率模块封装之间的感应开关损耗。sdd可以通过减少在硬切换事件中经历的反向恢复损失来显著降低切换损失。然而,sdd的加入减少了mosfet模块中可用的芯片面积,从而限制了最终产品的电流能力并增加了每安培的成本。本文研究了在高性能SiC功率模块中使用SiC mosfet和sdd与仅使用SiC mosfet之间的权衡。了解每种配置的交换性能将使定制的电源模块解决方案得到优化,从而最大限度地提高所需应用的性能。
Comparing the switching performance of SiC MOSFET intrinsic body diode to additional SiC schottky diodes in SiC power modules
This paper presents a comparison of the inductive switching losses between a 1200 V SiC MOSFET half bridge power module with anti-parallel SiC schottky barrier diodes (SBD) versus the same power module package utilizing only the intrinsic body diode of the SiC MOSFETs. SBDs can significantly reduce switching losses by reducing the reverse recovery losses experienced during hard-switching events. However, the inclusion of SBDs reduces the chip area available in the module for MOSFETs — thus limiting the current capability of the end product and increasing the cost per amp. This paper investigates the tradeoff between using both SiC MOSFETs and SBDs versus using only SiC MOSFETs in a high performance SiC power module. Understanding the switching performace of each configuration will enable customized power module solutions optimized to maximize performance of the desired application.