高斯光束和顶帽光束在LIDT测试中的比较

SPIE Laser Damage Pub Date : 2007-12-20 DOI:10.1117/12.752873

L. Jensen, M. Jupé, K. Starke, D. Ristau, W. Riede, P. Allenspacher

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引用次数: 3

摘要

ISO 11254 LIDT测试标准提出了两种可能用于损伤测试的空间梁廓形。因此，在不同光束直径下，用高斯TEM00和顶帽光束轮廓测试了一组相等的样品。研究发现，对于所研究的HfO2/SiO2高反射镜，在355nm处光束直径没有阈值依赖性。用高斯函数和顶帽梁测量的损伤阈值具有良好的相关性。

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Comparison of Gaussian and top-hat beam profiles in LIDT testing

The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM00 as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO2/SiO2 high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.

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SPIE Laser Damage

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