A. Devgan, R. Puri, Sachin Sapatnaker, T. Karnik, R. Joshi
{"title":"90纳米以下电路的设计与设计方法","authors":"A. Devgan, R. Puri, Sachin Sapatnaker, T. Karnik, R. Joshi","doi":"10.1109/ISQED.2005.45","DOIUrl":null,"url":null,"abstract":"Summary form only given. The tutorial discusses the design challenges of scaled CMOS circuits in sub-90 nm technologies and the design methodologies required in order to produce robust designs with the desired power-performance trade-off. We focus on four major components: design challenges of sub-90 nm CMOS circuits with particular emphasis on the implications of each individual device scaling element on circuit design; design methodologies for implementing robust circuits with desired power performance characteristics; managing leakage power; circuit design in the presence of uncertainty.","PeriodicalId":333840,"journal":{"name":"Sixth international symposium on quality electronic design (isqed'05)","volume":"196 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of sub-90 nm circuits and design methodologies\",\"authors\":\"A. Devgan, R. Puri, Sachin Sapatnaker, T. Karnik, R. Joshi\",\"doi\":\"10.1109/ISQED.2005.45\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Summary form only given. The tutorial discusses the design challenges of scaled CMOS circuits in sub-90 nm technologies and the design methodologies required in order to produce robust designs with the desired power-performance trade-off. We focus on four major components: design challenges of sub-90 nm CMOS circuits with particular emphasis on the implications of each individual device scaling element on circuit design; design methodologies for implementing robust circuits with desired power performance characteristics; managing leakage power; circuit design in the presence of uncertainty.\",\"PeriodicalId\":333840,\"journal\":{\"name\":\"Sixth international symposium on quality electronic design (isqed'05)\",\"volume\":\"196 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-03-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Sixth international symposium on quality electronic design (isqed'05)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2005.45\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sixth international symposium on quality electronic design (isqed'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2005.45","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of sub-90 nm circuits and design methodologies
Summary form only given. The tutorial discusses the design challenges of scaled CMOS circuits in sub-90 nm technologies and the design methodologies required in order to produce robust designs with the desired power-performance trade-off. We focus on four major components: design challenges of sub-90 nm CMOS circuits with particular emphasis on the implications of each individual device scaling element on circuit design; design methodologies for implementing robust circuits with desired power performance characteristics; managing leakage power; circuit design in the presence of uncertainty.