{"title":"高功率器件和模块在安全操作区域边缘及以外的高保真预测仿真","authors":"Gerhard Wachutka","doi":"10.1109/MIEL.2019.8889604","DOIUrl":null,"url":null,"abstract":"The development of high-performance power devices is increasingly supported by predictive computer simulations on the basis of well-calibrated physical device models. Today's challenge is to make virtual experiments and tests on the computer, which are qualitatively reliable and quantitatively accurate even for device structures that have never been built before, and under operational conditions that very rarely occur as long as the device is kept within the “safe operating area (SOA)”. What we are interested in is to explore the rim of the SOA and even to go beyond it in order to study failure and, eventually, destruction mechanisms with a view to improving robustness and reliability of the devices with respect to a customer-defined “mission profile”. In particular in the field of high power electronics, predictive high-fidelity computer simulations of “virtual desctruction” are of utmost importance. We will illustrate today's state of the art with reference to selected real-life examples.","PeriodicalId":391606,"journal":{"name":"2019 IEEE 31st International Conference on Microelectronics (MIEL)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-Fidelity Predictive Simulation of High Power Devices and Modules at the Rim of the Safe-Operating Area and Beyond\",\"authors\":\"Gerhard Wachutka\",\"doi\":\"10.1109/MIEL.2019.8889604\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The development of high-performance power devices is increasingly supported by predictive computer simulations on the basis of well-calibrated physical device models. Today's challenge is to make virtual experiments and tests on the computer, which are qualitatively reliable and quantitatively accurate even for device structures that have never been built before, and under operational conditions that very rarely occur as long as the device is kept within the “safe operating area (SOA)”. What we are interested in is to explore the rim of the SOA and even to go beyond it in order to study failure and, eventually, destruction mechanisms with a view to improving robustness and reliability of the devices with respect to a customer-defined “mission profile”. In particular in the field of high power electronics, predictive high-fidelity computer simulations of “virtual desctruction” are of utmost importance. We will illustrate today's state of the art with reference to selected real-life examples.\",\"PeriodicalId\":391606,\"journal\":{\"name\":\"2019 IEEE 31st International Conference on Microelectronics (MIEL)\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 31st International Conference on Microelectronics (MIEL)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIEL.2019.8889604\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 31st International Conference on Microelectronics (MIEL)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIEL.2019.8889604","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High-Fidelity Predictive Simulation of High Power Devices and Modules at the Rim of the Safe-Operating Area and Beyond
The development of high-performance power devices is increasingly supported by predictive computer simulations on the basis of well-calibrated physical device models. Today's challenge is to make virtual experiments and tests on the computer, which are qualitatively reliable and quantitatively accurate even for device structures that have never been built before, and under operational conditions that very rarely occur as long as the device is kept within the “safe operating area (SOA)”. What we are interested in is to explore the rim of the SOA and even to go beyond it in order to study failure and, eventually, destruction mechanisms with a view to improving robustness and reliability of the devices with respect to a customer-defined “mission profile”. In particular in the field of high power electronics, predictive high-fidelity computer simulations of “virtual desctruction” are of utmost importance. We will illustrate today's state of the art with reference to selected real-life examples.