{"title":"传输在线互连引起的Gbit/S集成电路的时间抖动和不稳定性","authors":"J. Hauenschild, H. Rein","doi":"10.1109/ESSCIRC.1989.5468081","DOIUrl":null,"url":null,"abstract":"The influence of transmission-line interconnections between high-speed IC's on time jitter and oscillations is investigated. Simple but flexible methods for estimating these effects are proposed and proved by measurements. The estimations are based on small-signal S-parameter simulations (or measurements). Moreover, various line terminations are discussed. A special Gbit/s bipolar IC was fabricated for the experiments.","PeriodicalId":187183,"journal":{"name":"ESSCIRC '89: Proceedings of the 15th European Solid-State Circuits Conference","volume":"629 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Time-Jitter and Instabilities of Gbit/S IC'S Caused by Transmission-Line Interconnections\",\"authors\":\"J. Hauenschild, H. Rein\",\"doi\":\"10.1109/ESSCIRC.1989.5468081\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The influence of transmission-line interconnections between high-speed IC's on time jitter and oscillations is investigated. Simple but flexible methods for estimating these effects are proposed and proved by measurements. The estimations are based on small-signal S-parameter simulations (or measurements). Moreover, various line terminations are discussed. A special Gbit/s bipolar IC was fabricated for the experiments.\",\"PeriodicalId\":187183,\"journal\":{\"name\":\"ESSCIRC '89: Proceedings of the 15th European Solid-State Circuits Conference\",\"volume\":\"629 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC '89: Proceedings of the 15th European Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.1989.5468081\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC '89: Proceedings of the 15th European Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.1989.5468081","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Time-Jitter and Instabilities of Gbit/S IC'S Caused by Transmission-Line Interconnections
The influence of transmission-line interconnections between high-speed IC's on time jitter and oscillations is investigated. Simple but flexible methods for estimating these effects are proposed and proved by measurements. The estimations are based on small-signal S-parameter simulations (or measurements). Moreover, various line terminations are discussed. A special Gbit/s bipolar IC was fabricated for the experiments.