{"title":"SiC-JFET和ESBT对MOSFET和IGBT的开关和导通性能","authors":"André Knop, W.-Toke Franke, Friedrich W. Fuchs","doi":"10.1109/EPEPEMC.2008.4635246","DOIUrl":null,"url":null,"abstract":"Here the switching and conducting performance of a SiC-JFET, an Emitter-Switching Bipolar Transistor (ESBT) and conventional power semiconductors as MOSFET and IGBT with Si- and SiC-diode is presented. The variety of power semiconductors is growing and there is a need to get rules to select them for the application given. The structure and special characteristics of the new devices are explained. The switching and conducting behavior of the devices is measured and investigated. The test circuit and the measurement method are presented. Based on the measured waveforms the power losses are calculated. The results of the switching and conducting performance of these power semiconductors are discussed.","PeriodicalId":149421,"journal":{"name":"2008 13th International Power Electronics and Motion Control Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Switching and conducting performance of SiC-JFET and ESBT against MOSFET and IGBT\",\"authors\":\"André Knop, W.-Toke Franke, Friedrich W. Fuchs\",\"doi\":\"10.1109/EPEPEMC.2008.4635246\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Here the switching and conducting performance of a SiC-JFET, an Emitter-Switching Bipolar Transistor (ESBT) and conventional power semiconductors as MOSFET and IGBT with Si- and SiC-diode is presented. The variety of power semiconductors is growing and there is a need to get rules to select them for the application given. The structure and special characteristics of the new devices are explained. The switching and conducting behavior of the devices is measured and investigated. The test circuit and the measurement method are presented. Based on the measured waveforms the power losses are calculated. The results of the switching and conducting performance of these power semiconductors are discussed.\",\"PeriodicalId\":149421,\"journal\":{\"name\":\"2008 13th International Power Electronics and Motion Control Conference\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 13th International Power Electronics and Motion Control Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPEMC.2008.4635246\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 13th International Power Electronics and Motion Control Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPEMC.2008.4635246","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Switching and conducting performance of SiC-JFET and ESBT against MOSFET and IGBT
Here the switching and conducting performance of a SiC-JFET, an Emitter-Switching Bipolar Transistor (ESBT) and conventional power semiconductors as MOSFET and IGBT with Si- and SiC-diode is presented. The variety of power semiconductors is growing and there is a need to get rules to select them for the application given. The structure and special characteristics of the new devices are explained. The switching and conducting behavior of the devices is measured and investigated. The test circuit and the measurement method are presented. Based on the measured waveforms the power losses are calculated. The results of the switching and conducting performance of these power semiconductors are discussed.