夹具去埋的解析和数值敏感性分析

2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-09-22 DOI:10.1109/ISEMC.2016.7571688

Bichen Chen, M. Tsiklauri, Chunyu Wu, Shuai Jin, J. Fan, X. Ye, Bill Samaras

{"title":"夹具去埋的解析和数值敏感性分析","authors":"Bichen Chen, M. Tsiklauri, Chunyu Wu, Shuai Jin, J. Fan, X. Ye, Bill Samaras","doi":"10.1109/ISEMC.2016.7571688","DOIUrl":null,"url":null,"abstract":"De-embedding procedures are sensitive to manufacturing variations in test fixtures, as well as inaccuracies associated with the calibration and measurement process. Such sensitivities can propagate through de-embedding procedures, resulting in amplified errors. In this paper, analytical and numerical techniques are used to perform sensitivity studies on both simulation and measurement data, with respect to de-embedding.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"383 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":"{\"title\":\"Analytical and numerical sensitivity analyses of fixtures de-embedding\",\"authors\":\"Bichen Chen, M. Tsiklauri, Chunyu Wu, Shuai Jin, J. Fan, X. Ye, Bill Samaras\",\"doi\":\"10.1109/ISEMC.2016.7571688\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"De-embedding procedures are sensitive to manufacturing variations in test fixtures, as well as inaccuracies associated with the calibration and measurement process. Such sensitivities can propagate through de-embedding procedures, resulting in amplified errors. In this paper, analytical and numerical techniques are used to perform sensitivity studies on both simulation and measurement data, with respect to de-embedding.\",\"PeriodicalId\":326016,\"journal\":{\"name\":\"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"volume\":\"383 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"28\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2016.7571688\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2016.7571688","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 28

摘要

去嵌入程序对测试夹具的制造变化以及与校准和测量过程相关的不准确性很敏感。这种敏感性可以通过去嵌入程序传播，导致误差放大。在本文中，分析和数值技术被用于执行灵敏度研究模拟和测量数据，关于去嵌入。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Analytical and numerical sensitivity analyses of fixtures de-embedding

De-embedding procedures are sensitive to manufacturing variations in test fixtures, as well as inaccuracies associated with the calibration and measurement process. Such sensitivities can propagate through de-embedding procedures, resulting in amplified errors. In this paper, analytical and numerical techniques are used to perform sensitivity studies on both simulation and measurement data, with respect to de-embedding.

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来源期刊

2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)

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