Kinam Kim
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引用次数: 0

摘要

对1T1C FRAM技术,特别是1T1C COB FRAM技术,从电池尺寸因素、铁电电容器和插头技术等关键问题的角度进行了综述和讨论。降低细胞尺寸因子对高密度应用至关重要。首先阐述了FRAM在实现小单元尺寸方面的不足,并提出了可能的解决方案。介绍了1T1C COB FRAM的高可靠性铁电电容器技术,并对其特有的1T1C COB FRAM的插头技术进行了高密度应用。介绍了1T1C FRAM设计技术的最新进展。有了这些技术,1T1C COB FRAM现在是高度可制造的,并显示出作为理想的新存储器的巨大潜力。
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1T1C FRAM
1T1C FRAM technology, especially 1T1C COB FRAM, is reviewed and discussed in views of key concerning issues such as cell size factor, ferroelectric capacitor and plug technology. The reduction of cell size factor is essential for high-density application. The weakness of FRAM in achieving small cell size is firstly expounded, and possible solution is proposed. The highly reliable ferroelectric capacitor technology for 1T1C FRAM is introduced and its own peculiar technology, plug technology, of 1T1C COB FRAM is dealt with for high-density application. The recent advances of design technology for 1T1C FRAM is also presented. With these technologies, 1T1C COB FRAM is now highly manufacturable and shows a great potential as an ideal new memory.
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