{"title":"适用于标准CMOS技术的高精度光学角度测量方法","authors":"C. Koch, J. Oehm, Andreas Gornik","doi":"10.1109/ESSCIRC.2009.5325982","DOIUrl":null,"url":null,"abstract":"In this paper a new concept for high precision angle measurement in standard CMOS technology is presented. In comparison to previous works, the complexness of the sensor topology is strongly reduced, the measuring range and the accuracy are significantly increased. The wavelength and the light intensity have a negligible influence on the accuracy of the sensor. In contrast to the previous concept, where SOI technology is mandatory, this new sensor concept can also be realised using standard CMOS technology.","PeriodicalId":258889,"journal":{"name":"2009 Proceedings of ESSCIRC","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"High precision optical angle measuring method applicable in standard CMOS technology\",\"authors\":\"C. Koch, J. Oehm, Andreas Gornik\",\"doi\":\"10.1109/ESSCIRC.2009.5325982\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper a new concept for high precision angle measurement in standard CMOS technology is presented. In comparison to previous works, the complexness of the sensor topology is strongly reduced, the measuring range and the accuracy are significantly increased. The wavelength and the light intensity have a negligible influence on the accuracy of the sensor. In contrast to the previous concept, where SOI technology is mandatory, this new sensor concept can also be realised using standard CMOS technology.\",\"PeriodicalId\":258889,\"journal\":{\"name\":\"2009 Proceedings of ESSCIRC\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 Proceedings of ESSCIRC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.2009.5325982\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Proceedings of ESSCIRC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.2009.5325982","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High precision optical angle measuring method applicable in standard CMOS technology
In this paper a new concept for high precision angle measurement in standard CMOS technology is presented. In comparison to previous works, the complexness of the sensor topology is strongly reduced, the measuring range and the accuracy are significantly increased. The wavelength and the light intensity have a negligible influence on the accuracy of the sensor. In contrast to the previous concept, where SOI technology is mandatory, this new sensor concept can also be realised using standard CMOS technology.