{"title":"OBIST策略与参数测试——有源模拟滤波器中覆盖灾难性故障的效率","authors":"D. Arbet, G. Gyepes, J. Brenkus, V. Stopjaková","doi":"10.1109/DDECS.2012.6219053","DOIUrl":null,"url":null,"abstract":"This paper deals with the comparison of the fault coverage of catastrophic faults in active analog integrated filter obtained by the measurement of filter parameters and by the Oscillation-based Built-In Self Test (OBIST) approach. In our experiment, firstly, the cut-off frequency, ripple in the pass band, DC gain in pass band and group delay of the filters have been monitored in the operating mode. Then, during the test mode (OBIST), the filter is transformed to an oscillator, and the oscillation frequency is compared to the frequency from a dedicated on-chip reference oscillator to compensate undesired influence of technology variations. The obtained results on the efficiency of both approaches are compared.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters\",\"authors\":\"D. Arbet, G. Gyepes, J. Brenkus, V. Stopjaková\",\"doi\":\"10.1109/DDECS.2012.6219053\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper deals with the comparison of the fault coverage of catastrophic faults in active analog integrated filter obtained by the measurement of filter parameters and by the Oscillation-based Built-In Self Test (OBIST) approach. In our experiment, firstly, the cut-off frequency, ripple in the pass band, DC gain in pass band and group delay of the filters have been monitored in the operating mode. Then, during the test mode (OBIST), the filter is transformed to an oscillator, and the oscillation frequency is compared to the frequency from a dedicated on-chip reference oscillator to compensate undesired influence of technology variations. The obtained results on the efficiency of both approaches are compared.\",\"PeriodicalId\":131623,\"journal\":{\"name\":\"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)\",\"volume\":\"65 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-04-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2012.6219053\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2012.6219053","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters
This paper deals with the comparison of the fault coverage of catastrophic faults in active analog integrated filter obtained by the measurement of filter parameters and by the Oscillation-based Built-In Self Test (OBIST) approach. In our experiment, firstly, the cut-off frequency, ripple in the pass band, DC gain in pass band and group delay of the filters have been monitored in the operating mode. Then, during the test mode (OBIST), the filter is transformed to an oscillator, and the oscillation frequency is compared to the frequency from a dedicated on-chip reference oscillator to compensate undesired influence of technology variations. The obtained results on the efficiency of both approaches are compared.