{"title":"低成本制造可靠光电系统的问题","authors":"S. Leclerc, G. Subbarayan","doi":"10.1109/IEMT.1995.526204","DOIUrl":null,"url":null,"abstract":"A product with high assembly efficiency will, in general, have a low defect count. So, it may be expected that the application of DFA would improve the reliability of optoelectronic systems. Nevertheless, detailed reliability assessment of the product is necessary during the product design and development phase either to compare alternate designs or to assess potential reliability problems in a candidate design. The procedures for such a reliability assessment are discussed. The reliability of the \"electronics\" in an optoelectronic system is typically a function of component, interconnection, board, and subassembly reliabilities.","PeriodicalId":123707,"journal":{"name":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Issues in low-cost manufacture of reliable optoelectronic systems\",\"authors\":\"S. Leclerc, G. Subbarayan\",\"doi\":\"10.1109/IEMT.1995.526204\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A product with high assembly efficiency will, in general, have a low defect count. So, it may be expected that the application of DFA would improve the reliability of optoelectronic systems. Nevertheless, detailed reliability assessment of the product is necessary during the product design and development phase either to compare alternate designs or to assess potential reliability problems in a candidate design. The procedures for such a reliability assessment are discussed. The reliability of the \\\"electronics\\\" in an optoelectronic system is typically a function of component, interconnection, board, and subassembly reliabilities.\",\"PeriodicalId\":123707,\"journal\":{\"name\":\"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1995.526204\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1995.526204","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Issues in low-cost manufacture of reliable optoelectronic systems
A product with high assembly efficiency will, in general, have a low defect count. So, it may be expected that the application of DFA would improve the reliability of optoelectronic systems. Nevertheless, detailed reliability assessment of the product is necessary during the product design and development phase either to compare alternate designs or to assess potential reliability problems in a candidate design. The procedures for such a reliability assessment are discussed. The reliability of the "electronics" in an optoelectronic system is typically a function of component, interconnection, board, and subassembly reliabilities.