高均匀性铁电MoS2非易失性存储器阵列

Chunyang Li, Lu Li, Zhongyi Li, Fanqing Zhang, Lixin Dong, Jing Zhao
{"title":"高均匀性铁电MoS2非易失性存储器阵列","authors":"Chunyang Li, Lu Li, Zhongyi Li, Fanqing Zhang, Lixin Dong, Jing Zhao","doi":"10.1109/3M-NANO56083.2022.9941686","DOIUrl":null,"url":null,"abstract":"Ferroelectric field effect transistor (FeFET) based on two-dimensional (2D) materials is centered great expectations for next-generation non-volatile memory devices owing to its excellent properties. In this paper, we fabricated monolayer $\\text{MoS}_{2}$ FeFET devices array through coupling ferroelectric P(VDF - TrFE) as the dielectric layer. The $\\text{MoS}_{2}$ FeFET device demonstrated excellent storage performance, including high on/off current ratios $\\boldsymbol{(> 10^{6})}$, a broad memory window (~15 V), long endurance (>200 cycles), and retention time (>1000 s). In additional, attributed to the chemical vapor deposition (CVD) synthesis of large-scale uniform Mos2,the devices array shows consistent characteristics, which suggest huge potential integrated circuit applications in the future.","PeriodicalId":370631,"journal":{"name":"2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"88 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-08-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High Uniformity Ferroelectric MoS2 Nonvolatile Memory Array\",\"authors\":\"Chunyang Li, Lu Li, Zhongyi Li, Fanqing Zhang, Lixin Dong, Jing Zhao\",\"doi\":\"10.1109/3M-NANO56083.2022.9941686\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Ferroelectric field effect transistor (FeFET) based on two-dimensional (2D) materials is centered great expectations for next-generation non-volatile memory devices owing to its excellent properties. In this paper, we fabricated monolayer $\\\\text{MoS}_{2}$ FeFET devices array through coupling ferroelectric P(VDF - TrFE) as the dielectric layer. The $\\\\text{MoS}_{2}$ FeFET device demonstrated excellent storage performance, including high on/off current ratios $\\\\boldsymbol{(> 10^{6})}$, a broad memory window (~15 V), long endurance (>200 cycles), and retention time (>1000 s). In additional, attributed to the chemical vapor deposition (CVD) synthesis of large-scale uniform Mos2,the devices array shows consistent characteristics, which suggest huge potential integrated circuit applications in the future.\",\"PeriodicalId\":370631,\"journal\":{\"name\":\"2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)\",\"volume\":\"88 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-08-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/3M-NANO56083.2022.9941686\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/3M-NANO56083.2022.9941686","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

基于二维(2D)材料的铁电场效应晶体管(FeFET)由于其优异的性能,被寄予了下一代非易失性存储器件的厚望。本文通过耦合铁电P(VDF - TrFE)作为介电层,制备了$\text{MoS}_{2}$ FeFET器件阵列。$\text{MoS}_{2}$ FeFET器件表现出优异的存储性能,包括高通断电流比$\boldsymbol{(> 10^{6})}$、宽存储窗口(~15 V)、长续航时间(>200次循环)和保持时间(>1000 s)。此外,由于化学气相沉积(CVD)合成大规模均匀Mos2,器件阵列显示出一致的特性,这表明未来集成电路应用潜力巨大。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High Uniformity Ferroelectric MoS2 Nonvolatile Memory Array
Ferroelectric field effect transistor (FeFET) based on two-dimensional (2D) materials is centered great expectations for next-generation non-volatile memory devices owing to its excellent properties. In this paper, we fabricated monolayer $\text{MoS}_{2}$ FeFET devices array through coupling ferroelectric P(VDF - TrFE) as the dielectric layer. The $\text{MoS}_{2}$ FeFET device demonstrated excellent storage performance, including high on/off current ratios $\boldsymbol{(> 10^{6})}$, a broad memory window (~15 V), long endurance (>200 cycles), and retention time (>1000 s). In additional, attributed to the chemical vapor deposition (CVD) synthesis of large-scale uniform Mos2,the devices array shows consistent characteristics, which suggest huge potential integrated circuit applications in the future.
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