2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - 最新文献
Pub Date : 2022-08-08
DOI: 10.1109/3M-NANO56083.2022.9941518
Runyi Yuan, Wei Si
Pub Date : 2022-08-08
DOI: 10.1109/3M-NANO56083.2022.9941529
M. V. Nikitin, S. G. Zybtsev, V. Pokrovskii, B. Loginov
Pub Date : 2022-08-08
DOI: 10.1109/3M-NANO56083.2022.9941660
Dongdong Liu, Ri Liu, Sadaf Saeed, Zuobin Wang, Litong Dong, Peter Bryanston-Cross
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