GaN外延衬底的ZnO原子层外延

M. Godlewski, A. Szczerbakow, K. Kopalko, E. Lusakowska, K. Butcher, E. Goldys, T. Tansley, A. Barski
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引用次数: 0

摘要

氧化锌层已经通过原子层外延生长,使用了该技术的气体流动版本。氧化锌薄膜可以通过双交换化学反应、单交换化学反应或单质组分(即锌和氧)制备。我们还研究了用ZnS层氧化法制备的ZnO层。硅([001]和[111]),砷化镓,蓝宝石,蓝宝石/氮化镓或钠石灰玻璃衬底已被使用。我们证明ZnO薄膜适合作为GaN外延的缓冲层。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Atomic layer epitaxy of ZnO for substrates for GaN epitaxy
ZnO layers have been grown by atomic layer epitaxy using a gas flow version of the technique. ZnO films have been obtained from either a double exchange chemical reaction, a single exchange reaction, or from elemental components, i.e., from zinc and oxygen. We have also studied ZnO layers prepared by the oxidisation of ZnS layers. Silicon ([001] and [111]), GaAs, sapphire, sapphire/GaN or soda lime glass substrates have been used. We demonstrate that ZnO films are suitable as buffer layers for GaN epitaxy.
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