顺序可测试性设计:100%故障覆盖率的内部状态重新播种方法

Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI:10.1109/ATS.2000.893657

M. Flottes, C. Landrault, A. Petitqueux

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引用次数: 2

摘要

提出了一种局部复位时观测点和触发器的选择方法。该方法的目标不是最小的DFT插入，而是最大限度地提高可测试性。提出的非扫描方法允许高速测试。实验结果表明，该方法在不需要扫描的情况下，可以实现100%的故障覆盖率和100%的故障效率，同时需要较少的ATPG (CPU时间)。

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Design for sequential testability: an internal state reseeding approach for 100 % fault coverage

This paper proposes a method to select observation points and flip-flops for partial reset. The method does not target minimum DFT insertion but a maximum improvement on testability. The proposed non-scan approach allows a at-speed testing. Experimental results show that the method achieves 100% fault coverage and 100% fault efficiency for benchmark circuits while requiring less ATPG effort (CPU time) with no scan necessity.

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Proceedings of the Ninth Asian Test Symposium

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