{"title":"电子开关系统磁泡存储器可靠性试验与评价","authors":"N. Yamaguchi, S. Hibi","doi":"10.1109/IRPS.1980.362917","DOIUrl":null,"url":null,"abstract":"The reliability of magnetic bubble memories were investigated to determine their applicability in electronic switching systems (ESS). The results revealed that reliability sufficient for a 22-year ESS life-time should be expected. Based on these results, thousand ESS magnetic bubble memory units with 4.3 Mbit capacity wEre produced and operated without any problems.","PeriodicalId":270567,"journal":{"name":"18th International Reliability Physics Symposium","volume":"232 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Reliability Testing and Evaluation of Magnetic Bubble Memories for Electronic Switching Systems\",\"authors\":\"N. Yamaguchi, S. Hibi\",\"doi\":\"10.1109/IRPS.1980.362917\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reliability of magnetic bubble memories were investigated to determine their applicability in electronic switching systems (ESS). The results revealed that reliability sufficient for a 22-year ESS life-time should be expected. Based on these results, thousand ESS magnetic bubble memory units with 4.3 Mbit capacity wEre produced and operated without any problems.\",\"PeriodicalId\":270567,\"journal\":{\"name\":\"18th International Reliability Physics Symposium\",\"volume\":\"232 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1980-04-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"18th International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.1980.362917\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"18th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1980.362917","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability Testing and Evaluation of Magnetic Bubble Memories for Electronic Switching Systems
The reliability of magnetic bubble memories were investigated to determine their applicability in electronic switching systems (ESS). The results revealed that reliability sufficient for a 22-year ESS life-time should be expected. Based on these results, thousand ESS magnetic bubble memory units with 4.3 Mbit capacity wEre produced and operated without any problems.
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