{"title":"亚微米电路的电源和接地可靠性问题","authors":"J.F. Tuan, T. K. Young","doi":"10.1109/WESCON.1995.485265","DOIUrl":null,"url":null,"abstract":"The reliability of the power supply network is becoming an important issue for IC designers as circuit sizes increase. The reliability problems in power networks are electromigration, voltage drop, and ground bounce. RailMill is an integrated environment that addresses the power network reliability problems. RailMill covers four important aspects in power network analysis: accurate extraction of power networks, accurate simulation of transistor circuits, accurate simulation of power networks and layout display of circuit and simulation results.","PeriodicalId":177121,"journal":{"name":"Proceedings of WESCON'95","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Reliability issues in power and ground on submicron circuits\",\"authors\":\"J.F. Tuan, T. K. Young\",\"doi\":\"10.1109/WESCON.1995.485265\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reliability of the power supply network is becoming an important issue for IC designers as circuit sizes increase. The reliability problems in power networks are electromigration, voltage drop, and ground bounce. RailMill is an integrated environment that addresses the power network reliability problems. RailMill covers four important aspects in power network analysis: accurate extraction of power networks, accurate simulation of transistor circuits, accurate simulation of power networks and layout display of circuit and simulation results.\",\"PeriodicalId\":177121,\"journal\":{\"name\":\"Proceedings of WESCON'95\",\"volume\":\"82 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-12-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of WESCON'95\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WESCON.1995.485265\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of WESCON'95","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WESCON.1995.485265","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability issues in power and ground on submicron circuits
The reliability of the power supply network is becoming an important issue for IC designers as circuit sizes increase. The reliability problems in power networks are electromigration, voltage drop, and ground bounce. RailMill is an integrated environment that addresses the power network reliability problems. RailMill covers four important aspects in power network analysis: accurate extraction of power networks, accurate simulation of transistor circuits, accurate simulation of power networks and layout display of circuit and simulation results.
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