用于系统级ESD噪声监测的片上示波器

Wooryong Lee, Junsik Park, Jingook Kim, Chunghyun Ryu, Jong-Sung Lee, B. Kang, Bumhee Bae
{"title":"用于系统级ESD噪声监测的片上示波器","authors":"Wooryong Lee, Junsik Park, Jingook Kim, Chunghyun Ryu, Jong-Sung Lee, B. Kang, Bumhee Bae","doi":"10.1109/ISEMC.2019.8825235","DOIUrl":null,"url":null,"abstract":"An on-die oscilloscope circuit is proposed for monitoring of system-level electrostatic discharge (ESD) noises at a power supply or signal line of an integrated circuit (IC). The noise waveform is sampled and converted to digital data in real time. ESD event detector circuits provide a trigger signal for holding the digital data when the ESD event is detected. The digital data are converted back to analog noise waveforms through post-processing. The operations of the proposed on-die oscilloscope circuit are validated in circuit simulations.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"181 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"An On-die Oscilloscope for System-Level ESD Noise Monitoring\",\"authors\":\"Wooryong Lee, Junsik Park, Jingook Kim, Chunghyun Ryu, Jong-Sung Lee, B. Kang, Bumhee Bae\",\"doi\":\"10.1109/ISEMC.2019.8825235\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An on-die oscilloscope circuit is proposed for monitoring of system-level electrostatic discharge (ESD) noises at a power supply or signal line of an integrated circuit (IC). The noise waveform is sampled and converted to digital data in real time. ESD event detector circuits provide a trigger signal for holding the digital data when the ESD event is detected. The digital data are converted back to analog noise waveforms through post-processing. The operations of the proposed on-die oscilloscope circuit are validated in circuit simulations.\",\"PeriodicalId\":137753,\"journal\":{\"name\":\"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)\",\"volume\":\"181 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2019.8825235\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2019.8825235","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

提出了一种用于监测集成电路电源或信号线上系统级静电放电噪声的片上示波器电路。对噪声波形进行采样并实时转换为数字数据。当检测到ESD事件时,ESD事件检测器电路提供一个触发信号来保持数字数据。通过后处理将数字数据转换回模拟噪声波形。电路仿真验证了所提出的片上示波器电路的工作原理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An On-die Oscilloscope for System-Level ESD Noise Monitoring
An on-die oscilloscope circuit is proposed for monitoring of system-level electrostatic discharge (ESD) noises at a power supply or signal line of an integrated circuit (IC). The noise waveform is sampled and converted to digital data in real time. ESD event detector circuits provide a trigger signal for holding the digital data when the ESD event is detected. The digital data are converted back to analog noise waveforms through post-processing. The operations of the proposed on-die oscilloscope circuit are validated in circuit simulations.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信