{"title":"非线性微波和射频应用的GaN和GaAs HEMT通道电流模型","authors":"A. Parker","doi":"10.1109/BCICTS50416.2021.9682497","DOIUrl":null,"url":null,"abstract":"An explicit drain current model accounts for channel charge and electron velocity in GaN and GaAs HEMTs. Saturated current is shown to be dependent on the bulk potential gradient and correct determination of mobility and peak velocity potential. As an advancement over existing approaches, the model produces an improved prediction of linearity and temperature dependence in a compact formulation. It offers superior high-order linearity prediction critical for wireless applications.","PeriodicalId":284660,"journal":{"name":"2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"GaN and GaAs HEMT Channel Current Model for Nonlinear Microwave and RF Applications\",\"authors\":\"A. Parker\",\"doi\":\"10.1109/BCICTS50416.2021.9682497\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An explicit drain current model accounts for channel charge and electron velocity in GaN and GaAs HEMTs. Saturated current is shown to be dependent on the bulk potential gradient and correct determination of mobility and peak velocity potential. As an advancement over existing approaches, the model produces an improved prediction of linearity and temperature dependence in a compact formulation. It offers superior high-order linearity prediction critical for wireless applications.\",\"PeriodicalId\":284660,\"journal\":{\"name\":\"2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BCICTS50416.2021.9682497\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BCICTS50416.2021.9682497","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
GaN and GaAs HEMT Channel Current Model for Nonlinear Microwave and RF Applications
An explicit drain current model accounts for channel charge and electron velocity in GaN and GaAs HEMTs. Saturated current is shown to be dependent on the bulk potential gradient and correct determination of mobility and peak velocity potential. As an advancement over existing approaches, the model produces an improved prediction of linearity and temperature dependence in a compact formulation. It offers superior high-order linearity prediction critical for wireless applications.