I. Vikulin, B. V. Korobitsin, P. Markolenko, O. A. Nazarenko
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DETECTION OF SIGNS OF DEGRADATION OF PHOSPHIDE-GALLIUM LEDS BY THE LEVEL OF LOW-FREQUENCY NOISES
The results of measurements of low-frequency noises of light-emitting diodes are considered. It has been established that LEDs with an increased level of noise or with anomalous their growth kinetics in the first hours of testing are potentially unreliable, that is, they show further rapid or catastrophic degradation (failure). The prospects of noise measurements for the selection of LEDs in terms of reliability are shown.
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