行为合成过程中泄漏功率的分析和降低

K. Khouri, N. Jha
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引用次数: 122

摘要

本文提出了一种高水平的泄漏功率分析与降低算法。该算法使用设备级泄漏模型对给定的寄存器传输级模块库进行预表征。这是用来估计由于漏电造成的电路功耗。该算法还可以识别和提取数据路径中频繁空闲的模块,从而有针对性地进行低泄漏优化。漏电优化是基于使用双阈值电压(V/sub T/)技术。该算法优先考虑的模块给出了一个高层次的综合(HLS)系统,在哪里可以找到减少泄漏的最大收益的指示。结果表明,在不同的技术世代中,在HLS中使用双v /sub T/库可以平均降低59%的泄漏功率。与仅针对开关功率优化的寄存器传输电平(RTL)电路相比,在0.18 /spl mu/m至0.07 /spl mu/m技术下,总功率可平均降低18.8%至45.4%。泄漏功率对开关功率优化RTL电路总功耗的贡献在23.5% ~ 54.1%之间。我们的方法将这些值降低到11.4%到25.9%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Leakage power analysis and reduction during behavioral synthesis
This paper presents a high-level leakage power analysis and reduction algorithm. The algorithm uses device-level models for leakage to pre-characterize a given register-transfer level module library. This is used to estimate the power consumption of a circuit due to leakage. The algorithm can also identify and extract the frequently idle modules in the datapath, which may be targeted for low-leakage optimization. Leakage optimization is based on the use of dual threshold voltage (V/sub T/) technology. The algorithm prioritizes modules giving a high level synthesis (HLS) system an indication of where most gains for leakage reduction may be found. Results show that using a dual-V/sub T/ library during HLS can reduce leakage power by an average of 59% for the different technology generations. Total power can be reduced by an average of 18.8% to 45.4% for 0.18 /spl mu/m to 0.07 /spl mu/m technologies, respectively, compared to register-transfer level (RTL) circuits optimized for switching power only. The contribution of leakage power to overall power consumption of switching power optimized RTL circuits ranges from 23.5% to 54.1%. Our approach reduced these values to 11.4% to 25.9%.
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