{"title":"行为合成过程中泄漏功率的分析和降低","authors":"K. Khouri, N. Jha","doi":"10.1109/ICCD.2000.878342","DOIUrl":null,"url":null,"abstract":"This paper presents a high-level leakage power analysis and reduction algorithm. The algorithm uses device-level models for leakage to pre-characterize a given register-transfer level module library. This is used to estimate the power consumption of a circuit due to leakage. The algorithm can also identify and extract the frequently idle modules in the datapath, which may be targeted for low-leakage optimization. Leakage optimization is based on the use of dual threshold voltage (V/sub T/) technology. The algorithm prioritizes modules giving a high level synthesis (HLS) system an indication of where most gains for leakage reduction may be found. Results show that using a dual-V/sub T/ library during HLS can reduce leakage power by an average of 59% for the different technology generations. Total power can be reduced by an average of 18.8% to 45.4% for 0.18 /spl mu/m to 0.07 /spl mu/m technologies, respectively, compared to register-transfer level (RTL) circuits optimized for switching power only. The contribution of leakage power to overall power consumption of switching power optimized RTL circuits ranges from 23.5% to 54.1%. Our approach reduced these values to 11.4% to 25.9%.","PeriodicalId":437697,"journal":{"name":"Proceedings 2000 International Conference on Computer Design","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"122","resultStr":"{\"title\":\"Leakage power analysis and reduction during behavioral synthesis\",\"authors\":\"K. Khouri, N. Jha\",\"doi\":\"10.1109/ICCD.2000.878342\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a high-level leakage power analysis and reduction algorithm. The algorithm uses device-level models for leakage to pre-characterize a given register-transfer level module library. This is used to estimate the power consumption of a circuit due to leakage. The algorithm can also identify and extract the frequently idle modules in the datapath, which may be targeted for low-leakage optimization. Leakage optimization is based on the use of dual threshold voltage (V/sub T/) technology. The algorithm prioritizes modules giving a high level synthesis (HLS) system an indication of where most gains for leakage reduction may be found. Results show that using a dual-V/sub T/ library during HLS can reduce leakage power by an average of 59% for the different technology generations. Total power can be reduced by an average of 18.8% to 45.4% for 0.18 /spl mu/m to 0.07 /spl mu/m technologies, respectively, compared to register-transfer level (RTL) circuits optimized for switching power only. The contribution of leakage power to overall power consumption of switching power optimized RTL circuits ranges from 23.5% to 54.1%. Our approach reduced these values to 11.4% to 25.9%.\",\"PeriodicalId\":437697,\"journal\":{\"name\":\"Proceedings 2000 International Conference on Computer Design\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"122\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 2000 International Conference on Computer Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCD.2000.878342\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2000 International Conference on Computer Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2000.878342","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Leakage power analysis and reduction during behavioral synthesis
This paper presents a high-level leakage power analysis and reduction algorithm. The algorithm uses device-level models for leakage to pre-characterize a given register-transfer level module library. This is used to estimate the power consumption of a circuit due to leakage. The algorithm can also identify and extract the frequently idle modules in the datapath, which may be targeted for low-leakage optimization. Leakage optimization is based on the use of dual threshold voltage (V/sub T/) technology. The algorithm prioritizes modules giving a high level synthesis (HLS) system an indication of where most gains for leakage reduction may be found. Results show that using a dual-V/sub T/ library during HLS can reduce leakage power by an average of 59% for the different technology generations. Total power can be reduced by an average of 18.8% to 45.4% for 0.18 /spl mu/m to 0.07 /spl mu/m technologies, respectively, compared to register-transfer level (RTL) circuits optimized for switching power only. The contribution of leakage power to overall power consumption of switching power optimized RTL circuits ranges from 23.5% to 54.1%. Our approach reduced these values to 11.4% to 25.9%.