使用单个灵敏度可配置的环形振荡器提取设备参数变化

Yuma Higuchi, Kenichi Shinkai, M. Hashimoto, R. Rao, S. Nassif
{"title":"使用单个灵敏度可配置的环形振荡器提取设备参数变化","authors":"Yuma Higuchi, Kenichi Shinkai, M. Hashimoto, R. Rao, S. Nassif","doi":"10.1109/ETS.2013.6569366","DOIUrl":null,"url":null,"abstract":"The RO(Ring-Oscillator)-based sensor is one of easily-implementable variation sensors, but for decomposing the observed variability into multiple unique device-parameter variations, a large number of ROs with different structures and sensitivities to device-parameters is required. This paper proposes a scheme for sensing multiple device-parameter variations with just a single reconfigurable RO. This sensitivity-configurable RO has a number of configurations available and this property can be exploited for reducing sensor area while improving estimation accuracy through iterative estimation. To minimize the prospective error, the proposed estimation iterates: (1) selecting the best configuration that minimizes the prospective estimation error around the current estimates; and (2) updating the estimates with the selected configuration. This experiment was carried out assuming a 32-nm predictive technology model. Experimental results show that device-parameter extraction with a single RO is feasible and the error of the extracted parameters is reduced by 35 to 53% with the improved objective function and iterative estimation.","PeriodicalId":118063,"journal":{"name":"2013 18th IEEE European Test Symposium (ETS)","volume":"32 6","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Extracting device-parameter variations using a single sensitivity-configurable ring oscillator\",\"authors\":\"Yuma Higuchi, Kenichi Shinkai, M. Hashimoto, R. Rao, S. Nassif\",\"doi\":\"10.1109/ETS.2013.6569366\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The RO(Ring-Oscillator)-based sensor is one of easily-implementable variation sensors, but for decomposing the observed variability into multiple unique device-parameter variations, a large number of ROs with different structures and sensitivities to device-parameters is required. This paper proposes a scheme for sensing multiple device-parameter variations with just a single reconfigurable RO. This sensitivity-configurable RO has a number of configurations available and this property can be exploited for reducing sensor area while improving estimation accuracy through iterative estimation. To minimize the prospective error, the proposed estimation iterates: (1) selecting the best configuration that minimizes the prospective estimation error around the current estimates; and (2) updating the estimates with the selected configuration. This experiment was carried out assuming a 32-nm predictive technology model. Experimental results show that device-parameter extraction with a single RO is feasible and the error of the extracted parameters is reduced by 35 to 53% with the improved objective function and iterative estimation.\",\"PeriodicalId\":118063,\"journal\":{\"name\":\"2013 18th IEEE European Test Symposium (ETS)\",\"volume\":\"32 6\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 18th IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS.2013.6569366\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 18th IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2013.6569366","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

基于环形振荡器(Ring-Oscillator, RO)的传感器是一种易于实现的变化传感器,但为了将观测到的变异性分解为多个唯一的器件参数变化,需要大量具有不同结构和对器件参数敏感性的RO。本文提出了一种利用单个可重构RO来感知多个器件参数变化的方案。这种灵敏度可配置的RO有许多可用的配置,这种特性可以用于减少传感器面积,同时通过迭代估计提高估计精度。为了最小化预期误差,提出的估计迭代:(1)在当前估计周围选择最小化预期误差的最佳配置;(2)用选择的配置更新估计。本实验采用32nm预测技术模型进行。实验结果表明,采用改进的目标函数和迭代估计,单RO提取设备参数是可行的,提取参数的误差降低了35% ~ 53%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Extracting device-parameter variations using a single sensitivity-configurable ring oscillator
The RO(Ring-Oscillator)-based sensor is one of easily-implementable variation sensors, but for decomposing the observed variability into multiple unique device-parameter variations, a large number of ROs with different structures and sensitivities to device-parameters is required. This paper proposes a scheme for sensing multiple device-parameter variations with just a single reconfigurable RO. This sensitivity-configurable RO has a number of configurations available and this property can be exploited for reducing sensor area while improving estimation accuracy through iterative estimation. To minimize the prospective error, the proposed estimation iterates: (1) selecting the best configuration that minimizes the prospective estimation error around the current estimates; and (2) updating the estimates with the selected configuration. This experiment was carried out assuming a 32-nm predictive technology model. Experimental results show that device-parameter extraction with a single RO is feasible and the error of the extracted parameters is reduced by 35 to 53% with the improved objective function and iterative estimation.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信