{"title":"一种新颖的使用深度学习来优化信号完整性分析的解空间探索","authors":"Mruganka Kashyap, Kumar Keshavan, A. Varma","doi":"10.1109/EPEPS.2017.8329701","DOIUrl":null,"url":null,"abstract":"The enhanced complexity of electrical devices has increased the number of variables that directly or indirectly affect the output. Consequently, it has become imperative to explore the massive solution space during integrity analyses, without sacrificing accuracy and development time. In this paper, we offer a simple hybrid algorithm based on a Multi-Layer Perceptron that significantly works better than traditional methods like Least Squares, by balancing the requirements for high accuracy and less development time.","PeriodicalId":397179,"journal":{"name":"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"695 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A novel use of deep learning to optimize solution space exploration for signal integrity analysis\",\"authors\":\"Mruganka Kashyap, Kumar Keshavan, A. Varma\",\"doi\":\"10.1109/EPEPS.2017.8329701\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The enhanced complexity of electrical devices has increased the number of variables that directly or indirectly affect the output. Consequently, it has become imperative to explore the massive solution space during integrity analyses, without sacrificing accuracy and development time. In this paper, we offer a simple hybrid algorithm based on a Multi-Layer Perceptron that significantly works better than traditional methods like Least Squares, by balancing the requirements for high accuracy and less development time.\",\"PeriodicalId\":397179,\"journal\":{\"name\":\"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"695 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2017.8329701\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2017.8329701","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel use of deep learning to optimize solution space exploration for signal integrity analysis
The enhanced complexity of electrical devices has increased the number of variables that directly or indirectly affect the output. Consequently, it has become imperative to explore the massive solution space during integrity analyses, without sacrificing accuracy and development time. In this paper, we offer a simple hybrid algorithm based on a Multi-Layer Perceptron that significantly works better than traditional methods like Least Squares, by balancing the requirements for high accuracy and less development time.