{"title":"电容层析成像中的电场模拟","authors":"J. Kryszyn, W. Smolik, R. Szabatin, J. Mirkowski","doi":"10.1109/IST.2012.6295592","DOIUrl":null,"url":null,"abstract":"The applications of electric capacitance tomography require a custom-designed sensor with individually calculated sensitivity matrix. The sensor can be modeled using an electric field simulator. A highly advanced simulator QuickWave-3D was applied to generate a sensitivity matrix for a designed sensor. The calculation results are presented and compared with the results obtained using custom FEM software packages elaborated previously by our group. The custom solvers enable fast computation but simulate electric field in 2D and use regular square mesh which can cause insufficient discretization in some regions. In this paper the comparison of results obtained by two types of FEM solvers is presented. The comparison enables also a validation of 2D modeling and application of regular discretization mesh in our custom solvers.","PeriodicalId":213330,"journal":{"name":"2012 IEEE International Conference on Imaging Systems and Techniques Proceedings","volume":"40 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Electric field simulation in electrical capacitance tomography\",\"authors\":\"J. Kryszyn, W. Smolik, R. Szabatin, J. Mirkowski\",\"doi\":\"10.1109/IST.2012.6295592\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The applications of electric capacitance tomography require a custom-designed sensor with individually calculated sensitivity matrix. The sensor can be modeled using an electric field simulator. A highly advanced simulator QuickWave-3D was applied to generate a sensitivity matrix for a designed sensor. The calculation results are presented and compared with the results obtained using custom FEM software packages elaborated previously by our group. The custom solvers enable fast computation but simulate electric field in 2D and use regular square mesh which can cause insufficient discretization in some regions. In this paper the comparison of results obtained by two types of FEM solvers is presented. The comparison enables also a validation of 2D modeling and application of regular discretization mesh in our custom solvers.\",\"PeriodicalId\":213330,\"journal\":{\"name\":\"2012 IEEE International Conference on Imaging Systems and Techniques Proceedings\",\"volume\":\"40 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-07-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE International Conference on Imaging Systems and Techniques Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IST.2012.6295592\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Conference on Imaging Systems and Techniques Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IST.2012.6295592","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electric field simulation in electrical capacitance tomography
The applications of electric capacitance tomography require a custom-designed sensor with individually calculated sensitivity matrix. The sensor can be modeled using an electric field simulator. A highly advanced simulator QuickWave-3D was applied to generate a sensitivity matrix for a designed sensor. The calculation results are presented and compared with the results obtained using custom FEM software packages elaborated previously by our group. The custom solvers enable fast computation but simulate electric field in 2D and use regular square mesh which can cause insufficient discretization in some regions. In this paper the comparison of results obtained by two types of FEM solvers is presented. The comparison enables also a validation of 2D modeling and application of regular discretization mesh in our custom solvers.