M. Syal, M. Hsiao, K. B. Doreswamy, S. Chakravarty
{"title":"高效的基于隐式的不可测桥梁故障识别器","authors":"M. Syal, M. Hsiao, K. B. Doreswamy, S. Chakravarty","doi":"10.1109/VTEST.2003.1197680","DOIUrl":null,"url":null,"abstract":"This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation is first performed, as a preprocessing step, to identify nets which are uncontrollable to a specific logic value. Then, an implication-based analysis is carried out for each fault to determine if a particular fault is testable or not. We also use information about the untestable stuck-at faults to filter out some bridges early in the analysis process. The application of our technique to ISCAS '89 sequential benchmark circuits and a few industrial circuits showed that a large number of untestable bridges could be identified at a low cost, both in terms of memory and execution time.","PeriodicalId":292996,"journal":{"name":"Proceedings. 21st VLSI Test Symposium, 2003.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Efficient implication-based untestable bridge fault identifier\",\"authors\":\"M. Syal, M. Hsiao, K. B. Doreswamy, S. Chakravarty\",\"doi\":\"10.1109/VTEST.2003.1197680\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation is first performed, as a preprocessing step, to identify nets which are uncontrollable to a specific logic value. Then, an implication-based analysis is carried out for each fault to determine if a particular fault is testable or not. We also use information about the untestable stuck-at faults to filter out some bridges early in the analysis process. The application of our technique to ISCAS '89 sequential benchmark circuits and a few industrial circuits showed that a large number of untestable bridges could be identified at a low cost, both in terms of memory and execution time.\",\"PeriodicalId\":292996,\"journal\":{\"name\":\"Proceedings. 21st VLSI Test Symposium, 2003.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 21st VLSI Test Symposium, 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.2003.1197680\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 21st VLSI Test Symposium, 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.2003.1197680","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation is first performed, as a preprocessing step, to identify nets which are uncontrollable to a specific logic value. Then, an implication-based analysis is carried out for each fault to determine if a particular fault is testable or not. We also use information about the untestable stuck-at faults to filter out some bridges early in the analysis process. The application of our technique to ISCAS '89 sequential benchmark circuits and a few industrial circuits showed that a large number of untestable bridges could be identified at a low cost, both in terms of memory and execution time.